2022
DOI: 10.1002/advs.202105268
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Distinctive Deep‐Level Defects in Non‐Stoichiometric Sb2Se3 Photovoltaic Materials

Abstract: Characterizing defect levels and identifying the compositional elements in semiconducting materials are important research subject for understanding the mechanism of photogenerated carrier recombination and reducing energy loss during solar energy conversion. Here it shows that deep‐level defect in antimony triselenide (Sb2Se3) is sensitively dependent on the stoichiometry. For the first time it experimentally observes the formation of amphoteric SbSe defect in Sb‐rich Sb2Se3. This amphoteric defect possesses … Show more

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Cited by 51 publications
(42 citation statements)
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References 27 publications
(69 reference statements)
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“…In the Raman spectrum (Figure S6a, Supporting Information), the peaks at 152, 189, and 209 cm −1 correspond to the vibrations of Sb-Sb, Se-Sb-Se, and Se-Se bonds of Sb 2 Se 3 , respectively. [14] No Raman peak corresponding to Sb 2 O 3 was observed, which also indicates the phase purity of the obtained Sb 2 Se 3 film. The texture coefficient (TC (hkl) ) of Sb 2 Se 3 films on Sb-CdS and Cd-CdS substrates was calculated to examine the preferential crystallite alignment of the deposited Sb 2 Se 3 films according to the following equation: [15] / 1 0 1 0…”
Section: Resultsmentioning
confidence: 89%
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“…In the Raman spectrum (Figure S6a, Supporting Information), the peaks at 152, 189, and 209 cm −1 correspond to the vibrations of Sb-Sb, Se-Sb-Se, and Se-Se bonds of Sb 2 Se 3 , respectively. [14] No Raman peak corresponding to Sb 2 O 3 was observed, which also indicates the phase purity of the obtained Sb 2 Se 3 film. The texture coefficient (TC (hkl) ) of Sb 2 Se 3 films on Sb-CdS and Cd-CdS substrates was calculated to examine the preferential crystallite alignment of the deposited Sb 2 Se 3 films according to the following equation: [15] / 1 0 1 0…”
Section: Resultsmentioning
confidence: 89%
“…Combined with the theoretical calculation results, [21a,b,e,f,22] traps H1 and H2 located at ≈0.68 and 0.77 eV above the VBM (Figure 7c,d) can be classified as antimony vacancy (V Sb ) and selenium antisite defects (Se Sb ). [14] DLTS characterization reveals the nature of deep defects in Sb 2 Se 3 films. By comparing the activation energies of these trap defects, we find that they are similar in the two devices, indicating that the origins of these defects are the same.…”
Section: Resultsmentioning
confidence: 99%
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“…It was reported that point defects are easy to form in the Sb 2 Se 3 lattice in both the experimental results and first-principles calculations. 24,25 Here, we attribute the dynamic decay to defect-induced recombination at a low excitation intensity, which is common in semiconductor materials and extremely likely to take place due to the low defect formation energy. 24–27 Unexpectedly, the TA decays rapidly at higher excitation intensity, which corresponds to a larger photoexcited carrier density.…”
Section: Resultsmentioning
confidence: 99%
“…24,25 Here, we attribute the dynamic decay to defect-induced recombination at a low excitation intensity, which is common in semiconductor materials and extremely likely to take place due to the low defect formation energy. 24–27 Unexpectedly, the TA decays rapidly at higher excitation intensity, which corresponds to a larger photoexcited carrier density. This unusual recombination mechanism will be discussed later.…”
Section: Resultsmentioning
confidence: 99%