Distinct Gaussian Properties of Multiple Reflections in Extended Hemispherical Lenses

Ozbey, Burak; Sertel, Kubilay

doi:10.1007/s10762-019-00632-x

Cited by 3 publications

(2 citation statements)

References 21 publications

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Section: Discussionmentioning

confidence: 98%

“…The observed deviations in the beam profiles from a Gaussian beam may come from the coupling of the THz antenna and the Si lens [43][44][45]. It has been previously shown that small differences in the position of the lens with respect to the antenna can have significant effects on the profiles of the emitted radiation [43,44]. However, the antenna is positioned at the centre of the lens with an automated pick and place tool and the deviation from the central position is smaller than 20 µm.…”

Section: Discussionmentioning

confidence: 99%

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Beam Profile Characterisation of an Optoelectronic Silicon Lens-Integrated PIN-PD Emitter between 100 GHz and 1 THz

et al. 2021

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Knowledge of the beam profiles of terahertz emitters is required for the design of terahertz instruments and applications, and in particular for designing terahertz communications links. We report measurements of beam profiles of an optoelectronic silicon lens-integrated PIN-PD emitter at frequencies between 100 GHz and 1 THz and observe significant deviations from a Gaussian beam profile. The beam profiles were found to differ between the H-plane and the E-plane, and to vary strongly with the emitted frequency. Skewed profiles and irregular side-lobes were observed. Metrological aspects of beam profile measurements are discussed and addressed.

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