Dissolution of niobium and tantalum matrix and their separation from trace elements by means of extraction with diantipyrylmethanes

Caletka, R.; Kriváň, V.

doi:10.1007/bf00518217

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1985

1993

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Cited by 12 publications

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Determination of some trace elements in high‐purity tantalum metal by thin‐film x‐ray fluorescence spectrometry

Eddy

Balaes

1988

X-Ray Spectrometry

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The determination of niobium, molybdenum, tungsten, iron and titanium in tantalum metal is described. After dissolution of the metal a d extraction of the tantalum by a chromatographic method using tributyl phosphate, the trace elements are determined on thin-film samples by x-ray fluorescence spectrometry. The thin-film samples are prepared either by spotting the sample solutions directly on to filter-paper or by coprecipitation with indium. The limits of detection on the thin film are 0.05-0.7 pg, depending on the element being measured.

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