“…However, a model of these processes with predictive power has not yet been developed. DEAS and NIMS, closely connected with the ETS technique [5,10], give information on the dissociative decay channels which follow electron attachment. The DEA cross section σ DA (E) may be represented as the product of a capture cross section σ Cap (E) and the anion survival factor ρ [10,11], where E is the electron impact energy:…”