Dissemination of the Kilogram Following Its Redefinition

Stock, M.; Davidson, S.; Fang, H.

doi:10.21014/tc3-2022.011

Cited by 2 publications

(2 citation statements)

References 13 publications

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“…of the International Prototype of the Kilogram (IPK) would be 1 kg-0.002 mg, with an uncertainty of 0.020 mg [1]. The second key comparison, CCM.M-K8.2021, was launched in the second half of 2021 and was completed at the end of 2022 [2].…”

Section: Physical Metrologymentioning

confidence: 99%

News from the BIPM laboratories—2022

et al. 2023

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In order to fulfil its mission to ensure and promote the global comparability of measurements, the BIPM operates laboratories in the fields of physical metrology, time, ionizing radiation and chemistry. These laboratories act as centres for scientific and technical collaboration between Member States providing capabilities for international measurement comparisons on a shared cost basis. They coordinate international comparisons of national measurement standards agreed to be of the highest priority, and they establish and maintain appropriate reference standards for use as the basis of key international comparisons at the highest level and provide selected calibrations from them. In the following sections, we provide highlights of the work the laboratories have undertaken during 2022.

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Section: Physical Metrologymentioning

confidence: 99%

News from the BIPM laboratories—2022

et al. 2023

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“…The x-ray crystal density (XRCD) method [1][2][3][4][5][6] is one of the techniques used to accurately realise the kilogram, the basic unit of mass in the International System of Units (SI), defined by a fixed value of the Planck constant [7,8]. The measurement principle of the XRCD method is based on counting the number of Si atoms in a Si crystal, where a 1 kg Si crystal is shaped into a sphere [9] through an isotopic enrichment of 28 Si [10].…”

Section: Introductionmentioning

confidence: 99%

A numerical investigation of effective optical characteristics of dielectric mixture layer on Si sphere by FDTD method

Fujita,

Kuramoto

2024

Metrologia

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This paper reports on a numerical simulation of the optical characteristics of a dielectric mixture layer formed on a Si substrate using the finite-difference time-domain (FDTD) method. This study investigated the validity of using effective medium approximation (EMA) layers in thin mixture film problems with the optical constants of bulk materials. The complex reflection coefficients of Si substrates with randomly distributed thin mixture films fabricated from water/SiO2 and water/carbonaceous materials were numerically evaluated at normal and oblique incidences of plane electromagnetic waves via the FDTD principle, and the possible effects of the mixture layers on the effective optical characteristics were investigated. We observed that Bruggemann's model based on EMA provides a good prediction of the behaviour of the plane wave reflected by the Si surface with randomly distributed mixture layers. The results also suggested that mixture layers have effects under oblique incidence, but they have no significant impact under normal incidence.

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Dissemination of the Kilogram Following Its Redefinition

Cited by 2 publications

References 13 publications

News from the BIPM laboratories—2022

News from the BIPM laboratories—2022

A numerical investigation of effective optical characteristics of dielectric mixture layer on Si sphere by FDTD method

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