“…So far, the nature of the RESET process in the NiO film has not yet been completely elucidated . Most researchers believe that the RESET process is caused by oxygen ion migration-induced reoxidation of the conducting filaments ,,, without considering the migration of Ni ions. However, for the oxidation of Ni, it has been well established both experimentally and theoretically that, below 800 °C, the outward diffusion of Ni ions (produced due to ionization at the interface) through the NiO formed around Ni is the dominant transport process , with a slight inward diffusion of oxygen ions, while over 800 °C, oxygen ion transport also has to be taken into consideration .…”