2014
DOI: 10.1117/1.oe.53.9.092009
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Displacement measurements over a square meter area using digital holographic interferometry

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Cited by 13 publications
(2 citation statements)
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“…Digital holographic interferometry (DHI) is a high-resolution quantitative imaging method to extract the optical phase changes in light and has been widely used for NDT (Pryputniewicz, 1988;Newman, 2005;Ganesan, 2009), measurement of micro-to nanoscale displacements (Rastogi, 2013;De la Torre Ibarra et al, 2014;Hernández-Montes et al, 2020), vibrations (Pryputniewicz, 1985;Picart et al, 2005), and fluid mechanics (Cubreli et al, 2021;Psota et al, 2023), among other applications and physical phenomena. Conventional DHI methods, such as Electro Speckle Pattern Interferometry (ESPI) and Stetson holographic interferometry, use the use of lens components to relay the optical information of interest onto a recording media, in most cases a camera sensor.…”
Section: Introductionmentioning
confidence: 99%
“…Digital holographic interferometry (DHI) is a high-resolution quantitative imaging method to extract the optical phase changes in light and has been widely used for NDT (Pryputniewicz, 1988;Newman, 2005;Ganesan, 2009), measurement of micro-to nanoscale displacements (Rastogi, 2013;De la Torre Ibarra et al, 2014;Hernández-Montes et al, 2020), vibrations (Pryputniewicz, 1985;Picart et al, 2005), and fluid mechanics (Cubreli et al, 2021;Psota et al, 2023), among other applications and physical phenomena. Conventional DHI methods, such as Electro Speckle Pattern Interferometry (ESPI) and Stetson holographic interferometry, use the use of lens components to relay the optical information of interest onto a recording media, in most cases a camera sensor.…”
Section: Introductionmentioning
confidence: 99%
“…Advanced systems overcome the vibration problem by using very high speed cameras and high power lasers [23], [24]. A further way for reducing the sensitivity to external perturbations consists on utilizing long wave radiation, in the IR region 1551-319X © 2015 IEEE.…”
Section: Introductionmentioning
confidence: 99%