1972
DOI: 10.1080/713818559
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Displacement Measurement from Double-exposure Laser Photographs

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Cited by 285 publications
(35 citation statements)
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“…This scheme is close, in principle, to schemes used for the analysis of deformations of transparent objects, where the initial and inclined (with respect to the axis lying in the plane of an object) states of an object are recorded [13,14]. The spectrum of spatial frequencies is formed by optical system OS1.…”
Section: Aoz~k = Al Dnk(~k) D~kmentioning
confidence: 99%
“…This scheme is close, in principle, to schemes used for the analysis of deformations of transparent objects, where the initial and inclined (with respect to the axis lying in the plane of an object) states of an object are recorded [13,14]. The spectrum of spatial frequencies is formed by optical system OS1.…”
Section: Aoz~k = Al Dnk(~k) D~kmentioning
confidence: 99%
“…The technique has its genesis in a paper by Burch and Tokarski in 1968 [10]. However, major developments of the technique occurred in the 1970s by several investigators [11][12][13][14][15][16][17]. In the beginning laser speckles, which is the natural result of multiple interference of scattered coherent laser light, are used.…”
Section: The Technique Of Speckle Photographymentioning
confidence: 99%
“…Thus, phase information is lost but the method is very simple and easy to use. Traditionally, this technique has been applied to measure the in-plane displacements in solids (Archbold & Ennos, 1972), deformations (Fricke-Begemann, 2003) and roughness (Yamaguchi et al, 2004).…”
Section: Introductionmentioning
confidence: 99%