“…The possible mechanisms that can be responsible for such a shift are (i) the biaxial strain, 48 (ii) phonon localization, 49,50 and (iii) laserinduced heating in materials and tensile strain during Raman measurements. 49,50 As E 2 (high) peak is expected to shift to the higher frequency value as the compressive biaxial stress increases (and c-parameter value decreases), we assume the unusual shift of E 2 (high) peak to lower frequencies as c-parameter decreases in our samples can be due the second assumption, which is phonon localization by defects, such as those related to oxygen deficiency, 51 zinc excess or surface impurities, are in line with the PL and XRD measurements, suggesting that defects related to oxygen deficiency such as V O accompanied Gd dopants. Furthermore, we excluded the explanation related to laser-induced heating in materials and tensile strain during Raman as all samples were measured at the same time using the same conditions, and the laser power on the samples was $0.07 mW (to avoid the heating effect).…”