2006
DOI: 10.1002/xrs.904
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Dispersion corrections to the forward Rayleigh scattering amplitudes around the L‐shell of tantalum and lead

Abstract: Dispersion corrections to the forward Rayleigh scattering amplitudes of tantalum and lead in the photon energy range 6.4–24.14 keV were determined by a numerical evaluation of the dispersion integral that relates them through the optical theorem to the photoelectric cross‐sections. The photoelectric cross‐sections were extracted by subtracting the coherent and incoherent scattering contribution from the measured total attenuation cross‐section, using a high‐resolution, high‐purity germanium detector in a narro… Show more

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Cited by 4 publications
(6 citation statements)
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“…Many researchers have determined experimentally the anomalous scattering factors at various photon energies [15][16][17][18][19][20][21][22][23]. Normally, two methods are adopted to determine f and f values, namely the direct method and the indirect method.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Many researchers have determined experimentally the anomalous scattering factors at various photon energies [15][16][17][18][19][20][21][22][23]. Normally, two methods are adopted to determine f and f values, namely the direct method and the indirect method.…”
Section: Introductionmentioning
confidence: 99%
“…The indirect method is the attenuation method. In this method, the form factors are determined using either monoenergetic gamma sources or the synchrotron radiation [17][18][19][20][21][22][23]. Dreier et al [17] determined the anomalous x-ray scattering factors of Ni, Cu, Zn and Zr close to K absorption edges and of Ta, W, Pt and Au close to L edges by applying the dispersion relation to the absorption spectra.…”
Section: Introductionmentioning
confidence: 99%
“…Similarly, several investigators have experimentally determined atomic form factors for various elements at various energies [25][26][27][28][29][30][31][32][33][34][35][36]. Normally, two methods are adopted for measuring the form factors, namely the direct method and the attenuation method.…”
Section: Introductionmentioning
confidence: 99%
“…The direct method is based on (a) measurement of reflection and refraction [25,26], (b) determination of the intensities of the Bragg reflected rays [27,28] and (c) x-ray interferometry [29,30]. However, the measurement of atomic form factors using the attenuation method is more reliable [31][32][33][34][35][36] and does not suffer from the problems associated with the other methods. The other advantage of the attenuation method is that the atomic form factors can be determined for a larger range of atomic numbers over a wider range of x-ray or gamma-ray energies.…”
Section: Introductionmentioning
confidence: 99%
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