2013
DOI: 10.1063/1.4857035
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Disorder induced interface states and their influence on the Al/Ge nanowires Schottky devices

Abstract: Fermi level depinning in metal/Ge Schottky junction for metal source/drain Ge metal-oxide-semiconductor fieldeffect-transistor application J. Appl. Phys. 105, 023702 (2009)

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Cited by 16 publications
(10 citation statements)
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“…Similar results for different contact metals (Ti and Ni) confirm the presence of surface states, which pin the semiconductor Fermi level at the interface, making barrier height almost independent of the metal work functions [12,16].…”
supporting
confidence: 66%
See 1 more Smart Citation
“…Similar results for different contact metals (Ti and Ni) confirm the presence of surface states, which pin the semiconductor Fermi level at the interface, making barrier height almost independent of the metal work functions [12,16].…”
supporting
confidence: 66%
“…The best fit occurred for Raman shift (cm-1 ) Even having a highly crystalline structure our samples show a certain degree of disorder, especially at the surface, leading to localized energy states [12]. In this case, the transport mechanism usually observed is the variable range hopping (VRH) originally due to Mott and described by [13] per) = Po exp (�y' (1) where po and To are constants.…”
Section: E Xperimental M Ethodsmentioning
confidence: 94%
“…This electrical behavior was modeled using the back-toback Schottky model [8] under the usual thermionic emission theory assumptions. From this model we found barrier heights ranging from 0,41 to 0,51 eV regardless the different contact metals, which can be explained by the influence of surface states in the nanostructures [8,9].…”
Section: Resultsmentioning
confidence: 99%
“…The complexity of non-Ohmic contacts therefore makes comprehensive modelling of the ZnO nanowires difficult. One model which has been used successfully in the past to model non-Ohmic conduction treats both metal/semiconductor interfaces as Schottky diodes [218,219,220,221,222,223,224]. When metal comes into contact with a semiconductor, a Schottky barrier typically forms at the interface [202].…”
Section: Nanowire-metal Contacts and Schottky Barrier Modellingmentioning
confidence: 99%
“…While there are several ways of modelling back-to-back Schottky diodes, several of these rely on temperature-dependent measurements. In this chapter, we make use of the current density model first developed by Chiquito et al [218], and later used/adapted by others [219,220,221,222,223,224]. Diode measurements of nanowire devices are taken with no gate voltage applied, and the cross-sectional area of the nanowire is then ascertained using SEM.…”
Section: Nanowire-metal Contacts and Schottky Barrier Modellingmentioning
confidence: 99%