“…The atomic force microscope (AFM) 7 is a widely used characterization platform because in addition to providing high resolution images of the sample topography, advanced AFM techniques can also provide local mechanical, 8 electrical, 9 thermal, [10][11][12] etc. 15 PTMS has been applied to characterize polymers, 15,16 stem cells, 17 and cervical cancer cells. For example, scanning thermal microscopy (SThM) 10,11,13,14 relies on probe tips with either a thermocouple or an electrically resistive element to obtain high resolution maps of the sample's thermal conductivity.…”