We present a description of the capabilities and performance of the NAval Ultra-Trace Isotope Laboratory's Universal Spectrometer (NAUTILUS) at the U.S. Naval Research Laboratory. The NAUTILUS combines secondary ion mass spectrometry (SIMS) and single-stage accelerator mass spectrometry (SSAMS) into a single unified instrument for spatially resolved trace element and isotope analysis. The NAUTILUS instrument is essentially a fully functional SIMS instrument with an additional molecule-filtering detector, the SSAMS. The combination of these two techniques mitigates the drawbacks of each and enables new measurement paradigms for SIMS-like microanalysis. Highlighted capabilities include molecule-free raster ion imaging for direct spatially resolved analysis of heterogeneous materials with or without perturbed isotopic compositions. The NAUTILUS' sensitivity to trace elements is at least 10× better than commercial SIMS instruments due to near-zero background conditions. We describe the design and construction of the NAUTILUS, and its performance applied to topics in nuclear materials analysis, cosmochemistry, and geochemistry.
IntroductionAccelerator mass spectrometry (AMS) is synonymous with ultra-trace isotope analysis, while secondary ion mass spectrometry (SIMS) is the premier spatially resolved, sensitive, surface analysis technique. We have successfully designed and built the NAval Ultra-Trace Isotope Laboratory's Universal Spectrometer (NAUTILUS) at the U.S. Naval Research Laboratory (NRL) 4-9 , which combines the modified hardware from two commercial instruments, an Ametek Cameca ims 4f SIMS 10 and a National Electrostatics Corporation (NEC) single-stage AMS (SSAMS) 11-13 , together with custom control hardware and software. The motivation for this novel combination MS-MS instrument is to utilize the aforementioned advantages of each technique in a manner which simultaneously mitigates each technique's drawbacks. While SIMS maintains excellent sensitivity for materials analysis with down to micrometer spatial and nanometer depth resolution, the sputtering process produces molecular secondary ions. These may interfere at the same mass-tocharge ratio (m/z) with isotopes of interest, especially for high-mass and/or trace analyses. The trade-off between increased mass resolving power (MRP), typically defined as the full width at 10% peak height, and decreased instrumental transmission can make high-mass analyses impractical, especially for trace isotopes (e.g., detection of 236 U in the presence of 235 U 1 H) 14 . AMS excels at removing molecular isobaric interferences, but these instruments typically analyze bulk samples without spatial resolution either due to chemical sample preparation or large sputter source size. While SIMS may analyze positive or negative secondary ions, tandem AMS instruments are limited to injecting negative ions. This dramatically decreases their sensitivity to electropositive elements, since molecular ions such as FeOor UOmust be generated to transport the element of interest, Fe or U,...