2017
DOI: 10.1016/j.jallcom.2017.06.329
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Directional solidification of a Sn-0.2Ni solder alloy in water-cooled copper and steel molds: Related effects on the matrix micromorphology, nature of intermetallics and tensile properties

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Cited by 19 publications
(19 citation statements)
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References 36 publications
(37 reference statements)
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“…The mold plates were polished to ensure the same contact surface with the solidified metal for both alloys. In this way, the procedures and analyses performed resemble and corroborate with the recent solidification studies found in the literature [27][28][29][30][31][32][33][34][35][36].…”
Section: Introductionsupporting
confidence: 85%
“…The mold plates were polished to ensure the same contact surface with the solidified metal for both alloys. In this way, the procedures and analyses performed resemble and corroborate with the recent solidification studies found in the literature [27][28][29][30][31][32][33][34][35][36].…”
Section: Introductionsupporting
confidence: 85%
“…For example, while much of the Sn-Ni phase diagram has been accurately determined recently [9][10][11], the least researched region is the Sn-rich end where the stable and metastable eutectic points exist [12][13][14]. Furthermore, while the crystal structure of metastable NiSn4 has been investigated [15][16][17], and the presence of eutectic NiSn4 has been confirmed after solidification [18][19][20], the conditions for the transition from stable to metastable eutectic growth have not been investigated.…”
Section: Introductionmentioning
confidence: 99%
“…This gives an acceptable explanation of why although λ 1 and λ 2 are finer at regions closer to the cooled bottom of the Bi-20 wt% Sb alloy casting, the HV values are lower as compared with those of positions toward the top of the DS casting. Although hardness can be considered an important characteristic for TIM applications, further tests involving other important properties are necessary such as tensile properties, [64] wettability of the alloy against different substrates, [65] and the corresponding thermal interface resistance. [66]…”
Section: Resultsmentioning
confidence: 99%