Direct scanning tunneling microscope detection of laser induced ultrasonic pulses with nanometer resolution

Jersch, J.; Demming, F.; Федотов, И. В.; Dickmann, K.

doi:10.1063/1.1150115

Cited by 3 publications

(1 citation statement)

References 11 publications

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“…Two of the earliest are scanning local acceleration microscopy (SLAM) (76) and scanning microdeformation microscopy (SMM) (77). Scanning tunneling microscopes have even been implemented to detect the near-field acoustic signals HS-SPM: high-speed surface property mapping (78,79). There have also been several intriguing efforts to operate at higher frequencies; such approaches generally incorporate heterodyne methods (80,81), essentially leveraging the nonlinear tip-sample coupling to generate difference frequency signals that are compatible with the bandwidth of typical lock-in amplifiers.…”

Section: Other Variationsmentioning

confidence: 99%

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Huey

2007

Annu. Rev. Mater. Res.

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Combining atomic force microscopy and ultrasonic methods allows near-field detection of acoustic signals and thereby otherwise inaccessible nanoscale mechanical characterization. The two predominant variations, ultrasonic force microscopy and atomic force acoustic microscopy, are reviewed in detail. Applications of each to ceramics, polymers, metals, biological materials, and even subsurface structures are discussed, with a particular emphasis on image contrast mechanisms, data analysis, and experimental challenges. Finally, recent advances of these concepts into high-speed surface property mapping are presented, demonstrating 100-fold enhancements in full-frame imaging speeds.

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Section: Other Variationsmentioning

confidence: 99%

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Huey

2007

Annu. Rev. Mater. Res.

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Femtosecond-Time-Resolved Scanning Tunneling Microscopy

Takeuchi

Shigekawa

Springer Series in Optical Sciences

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Nanosecond laser pulse induced vertical movement of thin gold films on silicon determined by a modified Michelson interferometer

et al. 2012

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The vertical movement of a 40 nm thin Au film on a silicon substrate during intense nanosecond (ns) laser irradiation is determined on the nm vertical and ns time scales using an optimized Michelson interferometer. The balanced setup with two detectors uses the inverse interference signal and accounts for transient reflectivity changes during irradiation. We show that a change in phase shift upon reflection must be taken into account to gain quantitative results. Three distinct fluence regimes can be distinguished, characterized by transient reflectivity behavior, dewetting processes and film detachment. Maximum displacement velocities are determined to be 0.6 mls and 1.9 mls below and above the melting threshold of the metal, respectively. Flight velocities of detaching liquid films are found to be between 30 and 70 m/s for many nanoseconds.

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Direct scanning tunneling microscope detection of laser induced ultrasonic pulses with nanometer resolution

Abstract: Articles you may be interested inMechanism of laser-induced nanomodification on hydrogen-passivated Si(100) surfaces underneath the tip of a scanning tunneling microscope

Cited by 3 publications

References 11 publications

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Femtosecond-Time-Resolved Scanning Tunneling Microscopy

Nanosecond laser pulse induced vertical movement of thin gold films on silicon determined by a modified Michelson interferometer

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