2006
DOI: 10.1088/0957-4484/17/15/056
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Direct observation of oxygen atoms in rutile titanium dioxide by spherical aberration corrected high-resolution transmission electron microscopy

Abstract: We have developed a spherical aberration corrected transmission electron microscopy (Cs-corrected TEM) technique that allows us to obtain clearer images in real space than ever before. We applied this technique to titanium oxide, in which light elements such as oxygen are difficult to observe using TEM because of its small cross section and electronic damage. In the present study, we successfully observed oxygen atoms in rutile TiO2. In addition, this direct observation of oxygen atoms enabled us to study the … Show more

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Cited by 40 publications
(37 citation statements)
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“…The experimental estimation of the position of oxygen in TiO 2 is also important, and spherical aberration corrected TEM has the possibility to see the oxygen columns directly. [18] But it is still difficult for spherical aberration corrected TEM to observe the oxygen columns at heterointerfaces between nanoparticles and metal oxide substrates, because thin samples are required for the observations. In any case, the status of the oxygen atoms at interfaces affecting the status of Au layers is the key issue on the mechanism of the catalytic activity of the Au/oxide catalysts.…”
Section: Resultsmentioning
confidence: 99%
“…The experimental estimation of the position of oxygen in TiO 2 is also important, and spherical aberration corrected TEM has the possibility to see the oxygen columns directly. [18] But it is still difficult for spherical aberration corrected TEM to observe the oxygen columns at heterointerfaces between nanoparticles and metal oxide substrates, because thin samples are required for the observations. In any case, the status of the oxygen atoms at interfaces affecting the status of Au layers is the key issue on the mechanism of the catalytic activity of the Au/oxide catalysts.…”
Section: Resultsmentioning
confidence: 99%
“…[4][5][6] As the sample is reduced, defect structures with long range order form: The so-called Magnéli phases. 3,7 X-ray diffraction measurements reveal that these phases are extended planar defect structures, 2,7,8 the crystallographic shear planes ͑CS͒.…”
Section: Introductionmentioning
confidence: 99%
“…Evidence of these phases is seen in the form of crystallographically oriented features (streaking and weak diffraction peaks) in addition to the primary peaks in an SAED image [182,186,[194][195][196]. An early example of this is seen in Fig.…”
Section: Interaction Of Point Defects In Reduced Tiomentioning
confidence: 94%
“…The most common characterization method for the identification of the presence of Magn'eli phases is by diffraction imaging [182,186,187,190,[194][195][196][197][198][199][200]. In polycrystalline samples, X-ray diffraction has been used to identify the formation of of new Magnélie phases in TiO 2 [190,[198][199][200].…”
Section: Interaction Of Point Defects In Reduced Tiomentioning
confidence: 99%
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