2018
DOI: 10.1016/j.msea.2017.09.020
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Direct observation of a coincident dislocation- and grain boundary-mediated deformation in nanocrystalline iron

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Cited by 11 publications
(4 citation statements)
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“…PED was introduced by Vincent and Midgley in 1994 as a way of recording diffraction intensity that better suits structure determination (29). It then began to gain momentum in the microscopic exploration of deformation behavior of materials due to its crystal orientation indexability and improved spatial resolution compared with EBSD (30)(31)(32)(33). For example, Vetterick et al directly observed grain boundary-mediated plasticity at a crack tip in nanocrystalline Fe using PED (30).…”
Section: Significancementioning
confidence: 99%
See 1 more Smart Citation
“…PED was introduced by Vincent and Midgley in 1994 as a way of recording diffraction intensity that better suits structure determination (29). It then began to gain momentum in the microscopic exploration of deformation behavior of materials due to its crystal orientation indexability and improved spatial resolution compared with EBSD (30)(31)(32)(33). For example, Vetterick et al directly observed grain boundary-mediated plasticity at a crack tip in nanocrystalline Fe using PED (30).…”
Section: Significancementioning
confidence: 99%
“…It then began to gain momentum in the microscopic exploration of deformation behavior of materials due to its crystal orientation indexability and improved spatial resolution compared with EBSD (30)(31)(32)(33). For example, Vetterick et al directly observed grain boundary-mediated plasticity at a crack tip in nanocrystalline Fe using PED (30). Leff, Weinberger, and Taheri demonstrated the viability and utility of estimating dislocation densities using PED misorientation data and discussed the interpretation of dislocation contents under different acquisition parameters (31).…”
Section: Significancementioning
confidence: 99%
“…This approach ignores the contribution of pairs/sets of statistically stored dislocations (SSD) that do not lead to a net orientation change within the ~5 nm spatial resolution of the ACOM-STEM maps. We analyzed the Nye dislocation density tensor [ 55 ] using an approach that was implemented in the past for electron backscatter diffraction [ 57 ], as well as ACOM-TEM data [ 41 , 58 ]. The GND scalar density ( ρ GND ) can be expressed as the entrywise norm of the Nye dislocation density tensor ( α ) divided by the length of the Burgers vector ( b ): where α ij corresponds to the curvature components of the dislocation density tensor.…”
Section: Resultsmentioning
confidence: 99%
“…This approach ignores the contribution of pairs/sets of statistically stored dislocations (SSD) that do not lead to a net orientation change within the~5 nm spatial resolution of the ACOM-STEM maps. We analyzed the Nye dislocation density tensor [55] using an approach that was implemented in the past for electron backscatter diffraction [57], as well as ACOM-TEM data [41,58]. The GND scalar density (ρ GND ) can be expressed as the entrywise norm of the Nye dislocation density tensor (α) divided by the length of the Burgers vector (b):…”
Section: Structural Observations and Deformation Characteristics Of The Nanocrystalline Palladium Filmmentioning
confidence: 99%