2018
DOI: 10.1021/acs.jpcc.8b03255
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Direct Observation and Quantitative Analysis of Mobile Frenkel Defects in Metal Halide Perovskites Using Scanning Kelvin Probe Microscopy

Abstract: Ion migration is seen as a primary stability concern of halide perovskite-based photovoltaic and optoelectronic devices. Here, we provide experimental studies of long-distance, reversible ion migration in methylammonium lead iodide (MAPbI3) and formamidinium lead iodide (FAPbI3) films. We use time-resolved scanning Kelvin probe microscopy on insulator-coated lateral electrodes to probe the dynamic redistribution of charged Frenkel defects over micrometer distances after application of an electric field. We com… Show more

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Cited by 60 publications
(72 citation statements)
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“…Schottky defects indeed have been shown to have reasonably small formation energy 40 . However, very recently, Kelvin probe microscopy experiments using a similar lateral device geometry as in this work, show the major prevalence of Frenkel defects and their long-range motion in an electric field 27 , 41 .…”
Section: Discussionmentioning
confidence: 56%
“…Schottky defects indeed have been shown to have reasonably small formation energy 40 . However, very recently, Kelvin probe microscopy experiments using a similar lateral device geometry as in this work, show the major prevalence of Frenkel defects and their long-range motion in an electric field 27 , 41 .…”
Section: Discussionmentioning
confidence: 56%
“…Halide perovskites possess a mixed electronic and ionic conductivity [50,64]. To understand the ionic conductivity of perovskites, both experimental [35,[65][66][67] and theoretical [64,[68][69][70][71] studies have been conducted. Yuan et al observed the formation of PbI 2 at the anode side in a lateral device structure under an external bias and its propagation towards the cathode has been studied by energy-dispersive x-ray spectroscopy (EDX) mapping, which is a direct experimental evidence for halide ion migration [35].…”
Section: Ion Migrationmentioning
confidence: 99%
“…We developed such a time-resolved method based on Kelvin probe force microscopy (KPFM) 3,4,[26][27][28][29][30][31] by decoupling the spatial mapping and the recording of the temporal evolution of the local contact potential difference (CPD). Thereby, we achieved sub-ms KPFM time resolution ( Fig.…”
Section: Introductionmentioning
confidence: 99%