Using scanning tunneling microscopy we have observed thermally induced dislocation glide in monolayer Cu films on Ru(0001) at room temperature. The motion is governed by a Peierls barrier that depends on the detailed structure of the dislocations, in particular upon whether the threading dislocations that terminate them are dissociated or not. Calculations based on the Frenkel-Kontorova model reproduce the threading dislocation structure and provide estimates of the Peierls barrier and dislocation stiffness which are consistent with experiment.