2020
DOI: 10.1155/2020/1317349
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Direct Least Absolute Deviation Fitting of Ellipses

Abstract: Scattered data from edge detection usually involve undesired noise which seriously affects the accuracy of ellipse fitting. In order to alleviate this kind of degradation, a method of direct least absolute deviation ellipse fitting by minimizing the 1 algebraic distance is presented. Unlike the conventional Show more

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