We have extended our recent molecular-dynamic simulations of memristors to include the effect of thermal inhomogeneities on mobile ionic species appearing during operation of the device. Simulations show a competition between an attractive short-ranged interaction between oxygen vacancies and an enhanced local temperature in creating/destroying the conducting oxygen channels. Such a competition would strongly affect the performance of the memristive devices.There are many challenges in understanding and controlling the coupled electronic and ionic kinetic phenomena dominating the behavior of oxide switching devices like Pt/TiO 2 /Pt, which is an exemplar memristor (resistor with memory) [1], a fourth passive circuit element originally postulated by Leon Chua in 1971 [2]. It has been demonstrated unambiguously that bipolar switching involves changes to the electronic barrier at the Pt/TiO 2 interface due to the drift of positively charged oxygen vacancies under an applied electric field [1]. Various direct measurements revealed formation of localized conducting channels in TiO 2 : pressure modulated conductance microscopy [3,4], conducting atomic force microscopy (AFM) [5], scanning transmission X-ray microscopy [6], and in-situ transmission electron microscopy [7]. On the basis of these measurements, it became quite clear that the vacancy drift towards the interface