2020
DOI: 10.1364/ao.390667
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Direct femtosecond laser ablation of large-area TaSe2, SnS2, and TiS2 thick films by a back ablation procedure

Abstract: Direct ablation of large-area graphene-like two-dimensional (2D) materials, i.e., tantalum diselenide ( T a S e 2 ), stannic disulfide ( S n S 2 ), and titanium disulfide ( T i S 2 ), by the back ablation method with a femtosecond laser with a repet… Show more

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Cited by 4 publications
(4 citation statements)
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“…To assess the quality and structure of the synthesized TiS 2 crystals at 800 °C, samples were carefully characterized by Raman spectroscopy and X-ray diffraction (XRD), as shown in Figure . The Raman spectrum of the TiS 2 crystals (Figure a) showed the in-plane (E g ) mode at 232 cm –1 and an out-of-plane (A 1g ) mode at 336 cm –1 , which are characteristic peaks of TiS 2 , as reported in the literature. As expected, pure titanium (smooth and structured) does not have any Raman fingerprints. The XRD spectrum of the synthesized TiS 2 (Figure b) showed peaks at 15.47°, 34.08°, 44.08°, 47.76°, 53.66°, 56.23°, 57.58°, 65.43°, and 72.10°, which correspond to the planes (001), (011), (012), (003), (110), (111), (103), (104), and (022), similar to the previously reported results.…”
Section: Resultssupporting
confidence: 79%
“…To assess the quality and structure of the synthesized TiS 2 crystals at 800 °C, samples were carefully characterized by Raman spectroscopy and X-ray diffraction (XRD), as shown in Figure . The Raman spectrum of the TiS 2 crystals (Figure a) showed the in-plane (E g ) mode at 232 cm –1 and an out-of-plane (A 1g ) mode at 336 cm –1 , which are characteristic peaks of TiS 2 , as reported in the literature. As expected, pure titanium (smooth and structured) does not have any Raman fingerprints. The XRD spectrum of the synthesized TiS 2 (Figure b) showed peaks at 15.47°, 34.08°, 44.08°, 47.76°, 53.66°, 56.23°, 57.58°, 65.43°, and 72.10°, which correspond to the planes (001), (011), (012), (003), (110), (111), (103), (104), and (022), similar to the previously reported results.…”
Section: Resultssupporting
confidence: 79%
“…Monolayer SnS 2 , for instance, is an N-type semiconductor with a carrier mobility of 10 cm 2 /Vs and a switching ratio of 10 8 , making it suitable for highperformance active modulation devices. [18][19][20][21] In this paper, we present a study on the active and passive polarization-sensitive characterization of a SnS 2 device in the THz range. We investigate the performance of the device with different dimensions, specifically 500, 600, and 700 μm, by comparing their device constants.…”
Section: Introductionmentioning
confidence: 99%
“…The planar structure of 2D layered semiconductor materials enhances the integration of nanoelectronic devices, simplifying the integration process and reducing complexity. Monolayer SnS 2 , for instance, is an N‐type semiconductor with a carrier mobility of 10 cm 2 /Vs and a switching ratio of 10 8 , making it suitable for high‐performance active modulation devices 18–21 …”
Section: Introductionmentioning
confidence: 99%
“…Scanning probe lithography, , focused ion beams, and direct laser patterning have been used to fabricate micro- and nanostructures in a noninvasive way. While scanning probe lithography works well for monolayer flakes, it is impractical for bulk materials.…”
mentioning
confidence: 99%