Direct Detectors for Electron Microscopy

Clough, R.; Moldovan, Grigore; Kirkland, AI

doi:10.1088/1742-6596/522/1/012046

Cited by 24 publications

(15 citation statements)

References 6 publications

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“…With the development of direct detection devices (DDD),31,82,83 the field of structural biology underwent a true resolution revolution 24–26,31. DDD cameras are capable of directly detecting electrons, avoiding blurring and improving recording speed.…”

Section: The Electron Microscopementioning

confidence: 99%

A Technical Introduction to Transmission Electron Microscopy for Soft‐Matter: Imaging, Possibilities, Choices, and Technical Developments

Franken

Grünewald

Boekema

et al. 2020

Small

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With a significant role in material sciences, physics, (soft matter) chemistry, and biology, the transmission electron microscope is one of the most widely applied structural analysis tool to date. It has the power to visualize almost everything from the micrometer to the angstrom scale. Technical developments keep opening doors to new fields of research by improving aspects such as sample preservation, detector performance, computational power, and workflow automation. For more than half a century, and continuing into the future, electron microscopy has been, and is, a cornerstone methodology in science. Herein, the technical considerations of imaging with electrons in terms of optics, technology, samples and processing, and targeted soft materials are summarized. Furthermore, recent advances and their potential for application to soft matter chemistry are highlighted.

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Section: The Electron Microscopementioning

confidence: 99%

A Technical Introduction to Transmission Electron Microscopy for Soft‐Matter: Imaging, Possibilities, Choices, and Technical Developments

Franken

Grünewald

Boekema

et al. 2020

Small

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“…recording at frame rates of 40 s −1 to 1600 s −1 with reasonable SNR. 39–40 Although they have been successfully employed for low dose imaging of biological samples, their applications for in situ TEM studies are still in the early stages. 41–42 …”

Section: Current Statusmentioning

confidence: 99%

Current status and future directions for in situ transmission electron microscopy

et al. 2016

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This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.

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“…So far EDI/KEDI experiments were performed by tuning standard microscopes, but it can be envisaged that the features of the EDI/KEDI optimized equipment could ameliorate the coherent diffraction imaging experiment by electron sources with higher coherence, shape optimized condenser apertures, or more sensitive and accurate electron detectors, such as the direct conversion devices recently available to improve the data acquired in the direct space [29], or higher dynamic range detectors to improve the data acquired in the reciprocal space [30].…”

Section: Conclusion and Future Perspectivesmentioning

confidence: 99%

Coherent Diffraction Imaging in Transmission Electron Microscopy for Atomic Resolution Quantitative Studies of the Matter

Carlino

Scattarella

et al. 2018

Materials

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The paper focuses on the development of electron coherent diffraction imaging in transmission electron microscopy, made in the, approximately, last ten years in our collaborative research group, to study the properties of materials at atomic resolution, overcoming the limitations due to the aberrations of the electron lenses and obtaining atomic resolution images, in which the distribution of the maxima is directly related to the specimen atomic potentials projected onto the microscope image detector. Here, it is shown how augmented coherent diffraction imaging makes it possible to achieve quantitative atomic resolution maps of the specimen atomic species, even in the presence of low atomic number atoms within a crystal matrix containing heavy atoms. This aim is achieved by: (i) tailoring the experimental set-up, (ii) improving the experimental data by properly treating parasitic diffused intensities to maximize the measure of the significant information, (iii) developing efficient methods to merge the information acquired in both direct and reciprocal spaces, (iv) treating the dynamical diffused intensities to accurately measure the specimen projected potentials, (v) improving the phase retrieval algorithms to better explore the space of solutions. Finally, some of the future perspectives of coherent diffraction imaging in a transmission electron microscope are given.

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Direct Detectors for Electron Microscopy

Cited by 24 publications

References 6 publications

A Technical Introduction to Transmission Electron Microscopy for Soft‐Matter: Imaging, Possibilities, Choices, and Technical Developments

A Technical Introduction to Transmission Electron Microscopy for Soft‐Matter: Imaging, Possibilities, Choices, and Technical Developments

Current status and future directions for in situ transmission electron microscopy

Coherent Diffraction Imaging in Transmission Electron Microscopy for Atomic Resolution Quantitative Studies of the Matter

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