Direct deconvolution approach for depth profiling of element concentrations in multi-layered materials by confocal micro-beam X-ray fluorescence spectrometry

Wróbel, Paweł; Czyzycki, Mateusz

doi:10.1016/j.talanta.2013.03.087

Cited by 17 publications

(15 citation statements)

References 22 publications

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“…In order to use confocal XRF to determine the element concentration profiles in stratified materials, a direct deconvolution of the measured depth-dependent XRF intensity signal with the established response function of the spectrometer was developed. Since this method neglects the absorption of primary and secondary radiation within the probing volume, it is applicable only to low absorbing samples and small probing volumes (Wrobel and Czyzycki 2013). Moreover, a generalized mathematical model to describe the intensity of primary XRF radiation collected in the tilted confocal geometry mode has been provided, where the collimating optics in the detection channel is rotated over an angle relative to a horizontal plane.…”

Section: Quantitative Methods For Confocal Xrfmentioning

confidence: 99%

Confocal X-ray technology based on capillary X-ray optics

Sun¹,

Ding²

2015

Reviews in Analytical Chemistry

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Capillary X-ray optics is versatile, and it can be used with synchrotron radiation source, conventional X-ray source, laser-plasma ultrafast X-ray source, and so forth. Recently, the confocal X-ray technology based on capillary X-ray optics has become popular, and it has been widely used in X-ray fluorescence, X-ray absorption fine structure, X-ray diffraction, small-angle X-ray scattering, X-ray imaging, and X-ray scattering. This confocal X-ray technology has applications in many fields, including environmental monitoring, food science, life science, chemistry, physics, nanomaterials, nondestructive test, security check, and so on.

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Section: Quantitative Methods For Confocal Xrfmentioning

confidence: 99%

Confocal X-ray technology based on capillary X-ray optics

Sun¹,

Ding²

2015

Reviews in Analytical Chemistry

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“…Sequential series of confocal XRF measurements along lines and planes allows to visualize the distribution of chemical elements of interest in one or two dimensions, creating, for example, virtual depth profiles, and two-or three-dimensional distributions inside the materials of interest [23,100,101]. After its original introduction at synchrotron radiation facilities [97,[101][102][103][104][105], the feasibility of performing confocal XRF measurements using tube sources was demonstrated by several groups around the world [106][107][108][109][110], along with appropriate deconvolution, quantification, and simulation models [111][112][113][114][115][116][117][118]. Several papers have been recently been published where confocal XRF measurements are exploited for sub-surface examination of painted works of art [119][120][121][122][123][124], next to pottery [125], coins [86], stained glass [126,127], painted metal sheet [128], and natural rock samples [129].…”

Section: _####_ Page 6 Of 51mentioning

confidence: 99%

Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

et al. 2016

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Recent studies are concisely reviewed, in which X-ray beams of (sub)micrometre to millimetre dimensions have been used for non-destructive analysis and characterization of pigments, minute paint samples, and/or entire paintings from the seventeenth to the early twentieth century painters. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging, as well as with the combined use of X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Microscopic XRF is a variant of the method that is well suited to visualize the elemental distribution of key elements, mostly metals, present in paint multi-layers, on the length scale from 1 to 100 μm inside micro-samples taken from paintings. In the context of the characterization of artists' pigments subjected to natural degradation, the use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS and μ-XRD have proven themselves to be very suitable for such studies. Their use is often combined with microscopic Fourier transform infra-red spectroscopy and/or Raman microscopy since these methods deliver complementary information of high molecular specificity at more or less the same length scale as the X-ray microprobe techniques. Since microscopic investigation of a relatively limited number of minute paint samples, taken from a given work of art, may not yield representative information about the entire artefact, several methods for macroscopic, non-invasive imaging have recently been developed. Those based on XRF scanning and full-field hyperspectral imaging appear very promising; some recent published results are discussed.

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“…32 The 2D image deconvolution approach proposed in this work is presented schematically in Figure 1, which serves to guide the reader; the concepts of the methodology will be explained step-by-step. Summed up briefly, a target ( Figure 1a) is oversampled, such that after signal deconvolution of pulse response peaks (Figure 1b), this approach produces a nuclide distribution image in which the ablation positions are artificially convolved (Figure 1c).…”

Section: ■ Theoretical Sectionmentioning

confidence: 99%

Submicrometer Imaging by Laser Ablation-Inductively Coupled Plasma Mass Spectrometry via Signal and Image Deconvolution Approaches

2015

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In this work, pre- and postacquisition procedures for enhancing the lateral resolution of laser ablation-inductively coupled plasma mass spectrometry (LA-ICPMS) in two- and three-dimensional (2D, 3D) nuclide distribution mapping beyond the laser beam waist are described. 2D images were constructed by projecting a rectangular grid of discrete LA positions, arranged at interspacings smaller than the dimensions of the laser beam waist, onto the sample surface, thus oversampling the region of interest and producing a 2D image convolved in the spatial domain. The pulse response peaks of a low-dispersion LA cell were isolated via signal deconvolution of the transient mass analyzer response. A 3D stack of 2D images was deconvolved by an iterative Richardson-Lucy algorithm with Total Variance regularization, enabling submicrometer image fidelity, demonstrated in the analysis of trace level features in corroded glass. A point spread function (PSF) could be derived from topography maps of single pulse craters from atomic force microscopy. This experimental PSF allows the approach to take into account the laser beam shape, beam aberrations, and the laser-solid interaction, which in turn enhances the spatial resolution of the reconstructed volume.

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Direct deconvolution approach for depth profiling of element concentrations in multi-layered materials by confocal micro-beam X-ray fluorescence spectrometry

Cited by 17 publications

References 22 publications

Confocal X-ray technology based on capillary X-ray optics

Confocal X-ray technology based on capillary X-ray optics

Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

Submicrometer Imaging by Laser Ablation-Inductively Coupled Plasma Mass Spectrometry via Signal and Image Deconvolution Approaches

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