2021
DOI: 10.1016/j.mssp.2020.105540
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Direct correlation of defects and dark currents of InGaAs/InP photodetectors

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Cited by 8 publications
(1 citation statement)
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“…Furthermore, it is noticed that the detector exhibits self-powered characteristics when illuminated, which also proves the successful construction of the heterojunction. The dark current value represents the noise level of the detector, which is determined by interface defects, trap density, junction area, electrode geometry, etc. At the same time, although the device exhibits a low dark current and rectification characteristics as mentioned above, due to the high carrier concentration of the ZTO and CuI thin films, the relatively rough surface brings imperfect interface contact, resulting in an increase of the system noise signal, which limits the further reduction of the dark current.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, it is noticed that the detector exhibits self-powered characteristics when illuminated, which also proves the successful construction of the heterojunction. The dark current value represents the noise level of the detector, which is determined by interface defects, trap density, junction area, electrode geometry, etc. At the same time, although the device exhibits a low dark current and rectification characteristics as mentioned above, due to the high carrier concentration of the ZTO and CuI thin films, the relatively rough surface brings imperfect interface contact, resulting in an increase of the system noise signal, which limits the further reduction of the dark current.…”
Section: Resultsmentioning
confidence: 99%