Handbook of X-Ray Imaging 2017
DOI: 10.1201/9781351228251-48
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Dimensional Metrology for Industrial Computed Tomography

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“…However, there are increasing demands to use XCT for dimensional metrology in recent years [174][175][176] due to the advantages of the technology to image non-line-ofsight features, especially for metal AM components. Industrial XCT and applications for dimensional metrology have been reviewed in [177,178]. Unlike contact coordinate measuring systems, the dimensional metrology framework for XCT is still under development.…”
Section: Xct For Dimensional Metrologymentioning
confidence: 99%
“…However, there are increasing demands to use XCT for dimensional metrology in recent years [174][175][176] due to the advantages of the technology to image non-line-ofsight features, especially for metal AM components. Industrial XCT and applications for dimensional metrology have been reviewed in [177,178]. Unlike contact coordinate measuring systems, the dimensional metrology framework for XCT is still under development.…”
Section: Xct For Dimensional Metrologymentioning
confidence: 99%