Digitization of imaging plates from Guinier powder X-ray diffraction cameras

Abstract

A Guinier camera equipped with an imaging plate is used to investigate and eliminate the sources of instrumental errors affecting the quality of the obtained scanned Guinier data. A program with a graphical user interface is presented which converts the data of the scanned images into different standard file formats for powder X-ray patterns containing intensities, their standard deviations and the diffraction angles. The program also allows for manual and automatic correction of the 2θ scale against a known reference material. It is shown using LaB6 that the exported X-ray diffraction patterns provide a 2θ scale reproducible enough to allow for averaging diffractograms obtained from different exposures of the imaging plate for the same sample. As shown on a mixture of NaCl and sodalite, the quality of the produced data is sufficient for Rietveld refinement. The software including source code is made available under a free software license.

The structure and phase transformations in fumed transition alumina by X-ray diffraction and solid-state NMR

“…The diffraction images were recorded on a BaFX:Eu-based imaging plate (IP) film. [34] During the measurements, the samples were sliding sideways in the X-ray beam. The X-ray exposed imaging plate was scanned using Typhoon FLA 7000 5/21 scanner (GE Company, USA).…”

The structure and phase transformations in fumed transition alumina by X-ray diffraction and solid-state NMR

“…BaFX:Eu-based imaging plate (IP) film. [34] During the measurements, the samples were sliding sideways in the X-ray beam. The X-ray exposed imaging plate was scanned using Typhoon FLA 7000 scanner (GE Company, USA).…”

“…All the recorded diffraction images were digitized using the IPreader software and the averaging of 64 scans for BET30 and 16 scans for the rest of the samples was done by a gnuplot tcl-script. [34] Rietveld refinement [35] and other types of line shape analyses were performed using TOPAS-Academic V7 software package. [36]…”

Combining NMR and impedance spectroscopy in situ to study the dynamics of solid ion conductors

“…A silicon dioxide standard (Quarzwerke Dörentrup “alpha SiO 2 quartz”, a finely ground standard for XRD, a = 4.9136 Å, c = 5.4054 Å) was used as a reference sample. IPreader software 43 was used for data extraction and TOPAS academic software package v.4 (ref. 44) for Rietveld refinement and quantitative phase analysis of the sample.…”