2015
DOI: 10.1017/s1431927615006625
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Digital Image Correlation of Heterogeneous Deformation in Polycrystalline Material with Electron Backscatter Diffraction

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Cited by 7 publications
(5 citation statements)
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“…High resolution digital image correlation (HR-DIC) was performed on each of the specimens. The samples were speckled with a self-assembled Au nano-particles as described by Kammers and Daly [21] with procedure outlined in [22]. Soak time for the Ti-6Al-4V specimens in the Au nano-particles solution varied from 5 to 10 days to produce a dense enough correlation pattern.…”
Section: Methodsmentioning
confidence: 99%
“…High resolution digital image correlation (HR-DIC) was performed on each of the specimens. The samples were speckled with a self-assembled Au nano-particles as described by Kammers and Daly [21] with procedure outlined in [22]. Soak time for the Ti-6Al-4V specimens in the Au nano-particles solution varied from 5 to 10 days to produce a dense enough correlation pattern.…”
Section: Methodsmentioning
confidence: 99%
“…Digital image correlation (DIC) involves tracking features on the material surface, in order to obtain a spatial field of the displacement and associated strain. As demonstrated by several researchers [26][27][28][29][30][31][32][33], since this method is scale invariant, DIC can be performed within a scanning electron microscope (SEM) to provide high resolution strain mapping. Further to understand the role of temperature, DIC has been used at elevated temperatures using optical methods [34], ultraviolet optics [35], and electron microscopy [28,36,37].…”
Section: Introductionmentioning
confidence: 99%
“…[4,5] Through the analysis of the strain field of the material, researchers can better understand and improve the properties of materials. [6][7][8] With the development of microstructural characterization techniques in recent years, the strain field in the distorted region can be analyzed by various experimental means, such as X-ray diffraction, [9][10][11][12] Raman scattering, [13] electron backscatter-diffraction, [14][15][16][17] neutron diffraction, [18,19] 4D scanning transmission DOI: 10.1002/crat.202100264 electron microscopy, [20] nano-beam electron diffraction, [21] high-resolution transmission electron microcopy and quantum mechanism, [22,23] and an improved flat-island approach. [24] Along with the great progress of the computer digital-image processing technology, the point-to-point resolution recognition technology of the super microscope technology has also made a breakthrough improvement.…”
Section: Introductionmentioning
confidence: 99%