2011 IEEE 6th International Design and Test Workshop (IDT) 2011
DOI: 10.1109/idt.2011.6123109
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Digital circuits verification with consideration of destabilizing factors

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(1 citation statement)
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“…A system development life cycle (SDLC) method was presented [13] for the asynchronous circuit verification, the method can be used to describe the desired asynchronous circuit behaviors and refine those descriptions. The verification approach of digital circuits by using a lot of internal and external destabilizing factors was investigated [14], the destabilizing factors impact on the circuit operations was considered when the verification was carried out. The verification of the nano CMOS circuit was discussed [15], and a gate model was given by using a simplified transistor model.…”
Section: Introductionmentioning
confidence: 99%
“…A system development life cycle (SDLC) method was presented [13] for the asynchronous circuit verification, the method can be used to describe the desired asynchronous circuit behaviors and refine those descriptions. The verification approach of digital circuits by using a lot of internal and external destabilizing factors was investigated [14], the destabilizing factors impact on the circuit operations was considered when the verification was carried out. The verification of the nano CMOS circuit was discussed [15], and a gate model was given by using a simplified transistor model.…”
Section: Introductionmentioning
confidence: 99%