Digital atomic force microscope Moiré method

Scanning moiré fringe imaging by scanning transmission electron microscopy

“…They also have been used in analyses of the HREM images of defects in silicon [18]. Furthermore, moiré fringe methods were reported in scanning surface imaging techniques, such as scanning electron microscope (SEM), atomic force microscopy (AFM) and scanning tunneling microscopy (STM) when they were employed for imaging periodic structures [16,19,20]. In TEM, the moiré fringe method has revealed dislocations at grain boundaries and the strain fields at interfaces [10,11,14,21].…”

A curved surface micro-moiré method and its application in evaluating curved surface residual stress

“…Residual stress is the stress within a material which is generated during the process of machining, alloying and jointing that can reduce the rigidity and stability of a component in service; hence it is vitally important to understand the state of residual stress distribution. The measurement of residual stress started in the 1930s and included destructive methods, such as the hole-drilling method, the cutting method and the layer stripping method, and non-destructive methods, such as x-ray diffraction, ultrasonics, magnetics and neutron diffraction [2][3][4][5][6]. Destructive methods are often combined with other methods for deformation measurement, such as the strain gauge technique, or optical methods, such as the moiré method or geometric phase analysis (GPA) methods [7][8][9], giving a wide range of applications in residual stress measurement.…”

AFM nanomoiré technique with phase multiplication

“…, 2 N . To avoid the latter limitation the digital AFM moiré method was proposed [5,6] with scanning lines replaced by the virtual reference grid generated numerically. Now, the orientation and pitch of the reference grid can be chosen arbitrarily.…”