2019
DOI: 10.1016/j.mssp.2019.04.014
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Diffusion of hydrogen atoms in silicon layers deposited from molecular beams on dielectric substrates

Abstract: In the paper, the processes occurring during low-temperature growth of non-hydrogenated amorphous Si and polycrystalline Si films on multilayer Si 3 N 4 /SiO 2 /c-Si substrates from molecular beams under conditions of ultrahigh vacuum are studied in detail. Diffusion of hydrogen atoms from a dielectric layer into the growing film is shown to accompany the growth of a silicon film on a Si 3 N 4 layer deposited by CVD or on a SiO 2 layer obtained by thermal oxidation of a silicon wafer. The process of hydrogen m… Show more

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Cited by 8 publications
(18 citation statements)
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“…CH3O -and H + , occupying different sites, will reflect different surface characteristics. As a result, the critical adsorption model is proven, which will help us study the subsequent metal deposition in detail [22,23]. The STM image of Si adatoms and the tunneling spectroscopy on the Si rest atom sites suggests that the CH 3 OH molecule dissociates on the Si adatom and rest atom by forming Si-OCH 3 and Si-H, respectively.…”
Section: Ch Oh = Ch O + Hmentioning
confidence: 84%
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“…CH3O -and H + , occupying different sites, will reflect different surface characteristics. As a result, the critical adsorption model is proven, which will help us study the subsequent metal deposition in detail [22,23]. The STM image of Si adatoms and the tunneling spectroscopy on the Si rest atom sites suggests that the CH 3 OH molecule dissociates on the Si adatom and rest atom by forming Si-OCH 3 and Si-H, respectively.…”
Section: Ch Oh = Ch O + Hmentioning
confidence: 84%
“…CH 3 O – and H + , occupying different sites, will reflect different surface characteristics. As a result, the critical adsorption model is proven, which will help us study the subsequent metal deposition in detail [ 22 , 23 ].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The Ge or Si layers were deposited from molecular beams (MB) on Si 3 N 4 /SiO 2 /Si(100) dielectric substrates in a Riber EVA32 ultrahigh vacuum (UHV) molecular beam epitaxy (MBE) chamber. The multilayer dielectric substrates were prepared as described in our previous articles [7]- [11]. It should be noticed that since the upper Si 3 N 4 layer was deposited by chemical vapor deposition (CVD) using pyrolysis of a monosilane-ammonia mixture at the temperature of 750°C for 60 min [7]- [11] it can contain up to 8% of H atoms [12], [13].…”
Section: Samplesmentioning
confidence: 99%
“…In [9], a comprehensive treatment of friction surfaces of steel parts was proposed, which increases the wear resistance of critical friction sites subjected to hydrogen wear, including: heat treatment to reduce grain sizes; dehydration to reduce the concentration of biographical hydrogen in the sample, ion implantation with silicon to reduce the diffusion of hydrogen from the lubricant or hydrogen-containing environment. In [10], it was proposed, as a measure to reduce the wear of parts operating in hydrogen-containing environments, diffusion siliconizing of friction surfaces. In [11], it was noted that diffusion siliconizing from high-molecular-weight organic silicon compounds using laser processing ensured formating on the surface of steel molds uniform defect-free layers consisting of higher iron silicides and α-phase with microhardness up to 114 MPa.…”
Section: Introductionmentioning
confidence: 99%