Diffraction elastic constants for the determination of stresses in textured cubic materials: An experimental test

Brakman, C. M.; Keijser, Th.H. de; Pers, N. M. van der; Penning, Paul; Radelaar, S.

doi:10.1080/01418618808209942

Cited by 10 publications

(5 citation statements)

References 14 publications

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“…The experimental stress factors were obtained by loading the specimen in a tensile testing device mounted on the diffractometer. Experimental details can be found in work by Brakman et al (1988). Experimentally determined (symbols) and calculated (lines) X-ray stress factors F 11 (a) and F 22 (b) for the 211 reflection of a cold-rolled ferritic steel sheet.…”

Section: General Least-squares Analysis Of Any Stress State For Macromentioning

confidence: 99%

“…Experimentally determined (symbols) and calculated (lines) X-ray stress factors F 11 (a) and F 22 (b) for the 211 reflection of a cold-rolled ferritic steel sheet. The rolling direction (RD), the transverse direction (TD), the loading direction and the direction of strain measurement are indicated in the figure (taken from Brakman et al, 1988).…”

Section: General Least-squares Analysis Of Any Stress State For Macromentioning

confidence: 99%

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Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

et al. 2005

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The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction. The various analysis methods and measurement strategies, in dependence on specimen and measurement conditions, are summarized and evaluated in this paper. First, different X-ray diffraction geometries (conventional or grazing incidence) are described. Then, the case of macroscopically elastically isotropic, untextured specimens is considered: from the simplest case of a uniaxial state of stress to the most complicated case of a triaxial state of stress. The treatment is organized according to the number of unknowns to be determined (i.e. the state of stress, principal axes known or unknown), the use of one or several values of the rotation angle ' and the tilt angle of the sample, and one or multiple hkl reflections. Next, the focus is on macroscopically elastically anisotropic (e.g. textured) specimens. In this case, the use of diffraction (X-ray) elastic constants is not possible. Instead, diffraction (X-ray) stress factors have to be used. On the basis of examples, it is demonstrated that successful diffraction stress analysis is only possible if an appropriate grain-interaction model is applied.

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Section: General Least-squares Analysis Of Any Stress State For Macromentioning

confidence: 99%

Section: General Least-squares Analysis Of Any Stress State For Macromentioning

confidence: 99%

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

et al. 2005

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“…In a similar way, X-ray stress factors can be calculated as the arithmetic average of the stress factors calculated according to the Reuss and the Voigt models (for example Serruys et al (1987) and Brakman (1988)). A generally accepted physical basis for mixing the Reuss and the Voigt models is lacking, but a few workers have tried to give a physical basis for such an averaging procedure (Serruys et al 1987(Serruys et al , 1989.…”

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confidence: 99%

The determination of stresses in thin films; modelling elastic grain interaction

Welzel

Leoni

Mittemeijer

2003

Philosophical Magazine

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X-ray diffraction is frequently employed for the analysis of mechanical stresses in polycrystalline specimens. To this end, suitable so-called diffraction elastic constants are needed for determining the components of the mechanical stress tensor from measured lattice strains. These diffraction elastic constants depend on the single-crystal elastic constants of the material considered and the so-called grain interaction, describing the distribution of stresses and strains over the crystallographically differently oriented crystallites composing the specimen. Well-known grain interaction models, as due to Voigt, to Reuss, to Neerfeld and Hill and to Eshelby and Kro¨ner, may be applied to bulk specimens, but they are generally not suitable for thin films. In this paper, an average 'effective' grain interaction model is proposed that consists of a linear combination of basic extreme models including new models specially suited to thin films. Experimental verification has been achieved by X-ray diffraction strain measurements performed on a sputter-deposited copper film. This is the first time that anisotropic grain interaction has been analysed quantitatively.

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“…It should be underlined that in the above method, the influence of such effects as the influence of stacking faults [59] or plastic incompatibility stresses [22,61] on the determined XSFs is significantly reduced since the effect of stress σ I ij on the lattice strain, defined in Eq. 1, is exclusively taken into account.…”

Section: Assessments Of X-ray Stress Factorsmentioning

confidence: 99%

A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing

et al. 2022

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Diffraction elastic constants for the determination of stresses in textured cubic materials: An experimental test

Cited by 10 publications

References 14 publications

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

The determination of stresses in thin films; modelling elastic grain interaction

A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing

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