Diffraction by Dielectric-Loaded Multiple Slits in a Conducting Plane: Tm Case

Abstract

Abstract-A new and exact series solution for the scattering and coupling problems by dielectric-loaded multiple slits in a perfectly conducting screen is presented. The case of normal incidence and TM polarization is considered. The scattered and transmitted fields are represented in terms of an infinite series of radial modes. By applying the appropriate boundary conditions, the coefficients of scattered and transmitted fields are obtained and some numerical results are given.

Analysis of a Hybrid Coupled System of ψ-Caputo Fractional Derivatives with Generalized Slit-Strips-Type Integral Boundary Conditions and Impulses

“…, p located at an arbitrary position in the aperture (slit)-the region of the boundary off the strips. Examples of such boundary conditions include scattering by slits silicon strips detectors for scanned multi-slit X-ray imaging, acoustic impedance of baffled strips radiators, diffraction from an elastic knife-edge adjacent to a strip, sound fields of infinitely long strips, dielectric-loaded multiple slits in a conducting plane, lattice engineering [25][26][27][28][29][30][31][32][33].…”

A Fast Simulation Method of Silicon Nanophotonic Echelle Gratings and Its Applications in the Design of on-Chip Spectrometers

“…Particularly, the rigorous coupled-wave analysis (RCWA) [14] is an effective numerical method for simulating the polarization-dependent diffraction property from a planar grating. Up till now, most references to the rigorous analysis of diffraction devices have implicitly assumed infinitely periodic elements [15][16][17][18], for which the eigenfunctions are known and used in an eigenfunction expansion of the diffracted fields. However, these methods can not be applied to finite and aperiodic elements such as echelle grating spectrometers.…”