Diffraction Angle Determination Using Cross-Correlation Algorithm for Double Exposure Method
Kenji SUZUKI,
Yasufumi MIURA
Abstract:A double exposure method (DEM) was proposed as a stress measurement method using hard synchrotron X-rays for coarse-grained materials or welded parts. Up until now in the DEM, methods such as function approximation and finding straight lines from diffraction spots have been tried. However, sufficient accuracy could not be obtained for images containing a mixture of diffraction spots and rings. In this study, a new method to determine the diffraction radius is proposed. We obtain the waves of circumferential in… Show more
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