Diffraction analysis of perovskite-like oxides containing irregular intergrowths

Olikhovska, L.; Ustinov, А.I.

doi:10.1107/s0021889808031919

Cited by 9 publications

(6 citation statements)

References 33 publications

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“…The dependency of the cell parameter b from the value of the Miller index k is found to be irregular (Figure 2b). Such an irregular change in the cell parameter, along with asymmetrical broadening, is one of the typical features of stacking faults (SFs) in various layered compounds [28]. For example, in layered superconductive oxides with the closest packing, SFs are presented as the alternations of two types of structural fragments.…”

Section: Resultsmentioning

confidence: 99%

“…We also expect a strong decrease in XRD intensity and counter-directional irregular shift of the reflections for crystallographic planes primarily aligned along the perovskite slabs in the structure (such as 0k0 or hkl with high k/h and k/l ratio). The primary reason for these facts is an appearance of a new structural block with interlayer distances different from such an undistorted structure [28], which is a special case of SF-B with t = 1/2. At the same time, the (111) crystallographic planes of the layered structure, which contain the closest packed fragments of perovskite slabs, are expected to be the least prone to disorder and the consequent loss of intensity, which agrees well with experimental XRD patterns (Figure 2a).…”

Section: Resultsmentioning

confidence: 99%

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Structural Disorder in Layered Hybrid Halide Perovskites: Types of Stacking Faults, Influence on Optical Properties and Their Suppression by Crystallization Engineering

et al. 2021

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Layered hybrid halide perovskites (LHHPs) are an emerging type of semiconductor with a set of unique optoelectronic properties. However, the solution processing of high-quality LHHPs films with desired optical properties and phase composition is a challenging task, possibly due to the structural disorder in the LHHP phase. Nevertheless, there is still a lack of experimental evidence and understanding of the nature of the structural disorder in LHHPs and its influence on the optical properties of the material. In the current work, using 2D perovskites (C4H9NH3)2(CH3NH3)n−1PbnI3n+1 (further BA2MAn−1PbnI3n+1) with n = 1–4 as a model system, we demonstrate that deviations in LHHPs optical properties and X-ray diffraction occur due to the presence of continuous defects—Stacking Faults (SFs). Upon analyzing the experimental data and modeled XRD patterns of a possible set of stacking faults (SFs) in the BA2MAPb2I7 phase, we uncover the most plausible type of SFs, featured by the thickness variation within one perovskite slab. We also demonstrate the successful suppression of SFs formation by simple addition of BAI excess into BA2MAn−1PbnI3n+1 solutions.

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Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

Structural Disorder in Layered Hybrid Halide Perovskites: Types of Stacking Faults, Influence on Optical Properties and Their Suppression by Crystallization Engineering

et al. 2021

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“…This epitaxial relation is also confirmed by the FFT patterns of Figure f, in which the diffraction spots of SiC {200} and Co {220} are very close to each other. Some streaks are observed in the FFT patterns, which originate from stacking faults, as shown in Figure e …”

Section: Resultsmentioning

confidence: 96%

Preparation of Highly Flexible SiC Nanowires by Fluidized Bed Chemical Vapor Deposition

Liu

Chang

et al. 2015

Chemical Vapor Deposition

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High flexible SiC nanowires with diameters in the range of 10 to 50 nm and lengths of several hundred micrometers to several millimeters are synthesized using a novel catalyst-assisted fluidized bed chemical vapor deposition method. Methyltrichlorosilane (MTS) is used as source material and particles containing cobalt were used as catalyst. The fluidized bed is specially designed to form a perpendicular uneven temperature distribution. Suspended nanosized liquid catalyst droplets are produced at middle high temperature zone and SiC nanowires are formed in situ on the catalyst droplets then accumulated at the upper part of fluidized bed. The nanowires exhibit a single crystal feature with some stacking faults. Transmission electron microscopy (TEM) analysis verifies a growth direction along the <111> axis of the nanowires. A blue shift optical emission band at about 420 nm is detected using photoluminescence spectroscopy. From the high-resolution TEM investigation, a nanoscale smooth plane between the nanowire and the catalyst tip is observed and the two phases exhibit highly epitaxial growth interface. The growth process of the nanowires is discussed and a possible formation mechanism is proposed.

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“…Stacking faults are widely known to have considerable effect on the diffraction patterns. Contrary to where each main (strongest) diffraction peak is in the same position as the corresponded Bragg reflection of the basic structure [1], the occurrence of the stacking faults affects diffraction-peak positions of the basic structure [5][6][7][8][9]. It is true for an ordered as well.…”

Section: Introductionmentioning

confidence: 99%

A New Diffraction Approach To Crystal Structure Determination of Nano-twined Martensites

Olikhovska

Ustinov

Glavatska

et al. 2009

ESOMAT 2009 - 8th European Symposium on Martensitic Transformations

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Abstract. The intensity diffracted by crystals containing twin boundaries of the system {110}, 0 1 1 were calculated in the reciprocal space assuming a short-range order in the twin-boundary distribution. The calculated intensity distributions have been analyzed to find the effect on the diffraction pattern of such parameters as (i) ratio b/a (c/a) between the crystal lattice constants, (ii) density of the twin boundaries, (iii) ratio between thicknesses of the twin-related lamellae, and (iv) crystallographic direction along which the intensity distribution is simulated. It is found that each of these parameters affects the diffraction-peak profiles and positions including the diffraction peaks of the basic structure. Therefore, the problem of the diffraction pattern identification for a twin-modulated crystal should be approached only by a combined consideration of the diffraction features.

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Diffraction analysis of perovskite-like oxides containing irregular intergrowths

Cited by 9 publications

References 33 publications

Structural Disorder in Layered Hybrid Halide Perovskites: Types of Stacking Faults, Influence on Optical Properties and Their Suppression by Crystallization Engineering

Structural Disorder in Layered Hybrid Halide Perovskites: Types of Stacking Faults, Influence on Optical Properties and Their Suppression by Crystallization Engineering

Preparation of Highly Flexible SiC Nanowires by Fluidized Bed Chemical Vapor Deposition

A New Diffraction Approach To Crystal Structure Determination of Nano-twined Martensites

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