1974
DOI: 10.1103/physrevb.10.5220
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Difference in conductivity between LiD and LiH crystals

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Cited by 66 publications
(31 citation statements)
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“…Their analyses in different temperature regimes allowed them to extract a migration barrier for the current-carrying defect, with a value E m =0.53 eV [8] or 0.54±0.02 eV [9]. This is in very good agreement with our calculated migration barrier of 0.51 eV for the V − Li and V + H defects (see Table I).…”
Section: Ev Respectivelysupporting
confidence: 76%
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“…Their analyses in different temperature regimes allowed them to extract a migration barrier for the current-carrying defect, with a value E m =0.53 eV [8] or 0.54±0.02 eV [9]. This is in very good agreement with our calculated migration barrier of 0.51 eV for the V − Li and V + H defects (see Table I).…”
Section: Ev Respectivelysupporting
confidence: 76%
“…Experimental values for the ionic conductivity were reported by Varotsos and Mourikis [8] and Ikeya [9]. Their analyses in different temperature regimes allowed them to extract a migration barrier for the current-carrying defect, with a value E m =0.53 eV [8] or 0.54±0.02 eV [9].…”
Section: Ev Respectivelymentioning
confidence: 99%
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“…Before an earthquake, the pressure increases in the future focal area and produces changes in various physical properties like porosity, conductivity , dielectric constant (Varotsos, 1978(Varotsos, , 1980, etc. In addition, it affects the relaxation time of electric dipoles which are formed in an ionic solid between introduced aliovalent impurities (Varotsos and Miliotis, 1974) and vacancies created for charge compensation (Varotsos and Mourikis, 1974;Kostopoulos et al, 1975). This relaxation time, τ , is given by the equation…”
Section: Introductionmentioning
confidence: 99%
“…Both the aforementioned procedures assume that no additional aliovalent impurities are present in the mixed system that may influence the dielectric and electrical properties [63][64][65].…”
Section: The Modelmentioning
confidence: 99%