2019
DOI: 10.1016/j.matlet.2019.02.026
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Dielectric response on ultraviolet light irradiation of Ba0.85Ca0.15Zr0.1Ti0.9O3 based ceramics

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Cited by 16 publications
(7 citation statements)
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“…These variations in the dielectric properties of the PZT films under UV illumination are due to the creation of oxygen vacancies at the metal–dielectric interface. [ 10 ] An internal barrier layer capacitor model suggests enhancement in the effective capacitance (or dielectric constant) under UV illumination. [ 10,41,42 ] Change in the value of dielectric constant of the fabricated ferroelectric capacitor is measured using the values of dielectric constant in the absence ( ε 0 ) and the presence of UV light illumination ( ε u ) and is given as Change in dielectric constant ( % ) = [ ε u ε o ε o ] × 100 …”
Section: Resultsmentioning
confidence: 99%
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“…These variations in the dielectric properties of the PZT films under UV illumination are due to the creation of oxygen vacancies at the metal–dielectric interface. [ 10 ] An internal barrier layer capacitor model suggests enhancement in the effective capacitance (or dielectric constant) under UV illumination. [ 10,41,42 ] Change in the value of dielectric constant of the fabricated ferroelectric capacitor is measured using the values of dielectric constant in the absence ( ε 0 ) and the presence of UV light illumination ( ε u ) and is given as Change in dielectric constant ( % ) = [ ε u ε o ε o ] × 100 …”
Section: Resultsmentioning
confidence: 99%
“…[ 3,8 ] Utilization of UV light is one of the ways to enhance and tune the dielectric and ferroelectric properties of the ferroelectrics. [ 9,10 ] There are a number of reports available on the tunable dielectric properties of ferroelectrics using UV illumination. Nathabumroong et al reported 19% dielectric enhancement in the presence of UV radiation for the lanthanum doped bismuth ferrite (BLFO) ceramic.…”
Section: Introductionmentioning
confidence: 99%
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“…Ba 0.85 Ca 0.15 Zr 0.1 Ti 0.9 O 3 (BCZT) is a lead-free ferroelectric material, which has exhibited a potential performance to replace PZT material in several electronic devices such as sensors, actuators, and capacitors [7] due to its suitable dielectric and piezoelectric properties. BCZT is quite sensitive with deviation from its stoichiometry and ion doping, which produced phase transition, crystal structure, and chemical defects [8,9]. The generated defects can dope free mobile charge carriers and enhance electronic and thermal transport in BCZT material [9].…”
Section: Introductionmentioning
confidence: 99%