Dielectric Properties of SnO<sub>2</sub> Thin Film Using SPR Technique for Gas Sensing Applications

Paliwal, Ayushi; Sharma, Anjali; Tomar, Monika; Gupta, Vinay

doi:10.1155/2014/656120

Cited by 5 publications

(4 citation statements)

References 10 publications

(14 reference statements)

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“…These values of n in the low energy side (before the minima) are close to the values obtained by Zou et al 42 where they found n for films of SnO 2 nanowires by using THz-TDS and obtained values of about 1.25-1.35 for temperatures of 10-300 K, where n increases with temperature. Paliwal et al 44 estimated the room temperature value of the complex refractive index at k = 633 nm for SnO 2 thin films to be 1:439 þ 0:032i, while the value obtained in this work is in the range 1:18 À 1:54 ð Þþ 0:013 À 0:040 ð Þ i. Thus, their value is within the range obtained in this work.…”

Section: Resultssupporting

confidence: 79%

Optical Parameters of Nanocrystalline SnO2:F Thin Films Prepared by the Spray Pyrolysis Method

Ikhmayies

2019

JOM

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SnO 2 thin films are usually used as fore contacts in superstrate thin film solar cells such as thin film CdS/CdTe solar cells. Doping SnO 2 with fluorine improves its electrical properties and increases its optical bandgap energy besides improving other optical parameters. SnO 2 :F thin films of thickness around 200 nm were deposited on glass substrates by the spray pyrolysis method at a substrate temperature T s = 480°C. X-ray diffraction and scanning electron microscopy showed that the films are nanocrystalline. The transmittance of the films was measured at room temperature in the wavelength range 290-1100 nm, and used to calculate the reflectance, which was in turn used to deduce the optical parameters, such as the extinction coefficient, refractive index, real and imaginary parts of the dielectric constant, and energy loss. The relationships between these parameters and photon energy were investigated and compared with the results obtained by other authors.

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Section: Resultssupporting

confidence: 79%

Optical Parameters of Nanocrystalline SnO2:F Thin Films Prepared by the Spray Pyrolysis Method

Ikhmayies

2019

JOM

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“…Σ substr is computed following literature precedent using an image charge model to account for interactions between the substrate and molecular electrons. The dielectric constants used for InSe, C 70 , C 8 -BTBT, and substrate (indium tin oxide) were 7.6, 5.0, 2.6, and 1.43, respectively.…”

Section: Methodsmentioning

confidence: 99%

Molecular-Scale Characterization of Photoinduced Charge Separation in Mixed-Dimensional InSe–Organic van der Waals Heterostructures

Zhong

Henning

et al. 2020

ACS Nano

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Layered indium selenide (InSe) is an emerging two-dimensional semiconductor that has shown significant promise for high-performance transistors and photodetectors. The range of optoelectronic applications for InSe can potentially be broadened by forming mixed-dimensional van der Waals heterostructures with zero-dimensional molecular systems that are widely employed in organic electronics and photovoltaics. Here, we report the spatially resolved investigation of photoinduced charge separation between InSe and two molecules (C70 and C8-BTBT) using scanning tunneling microscopy combined with laser illumination. We experimentally and computationally show that InSe forms type-II and type-I heterojunctions with C70 and C8-BTBT, respectively, due to an interplay of charge transfer and dielectric screening at the interface. Laser-excited scanning tunneling spectroscopy reveals a ∼0.25 eV decrease in the energy of the lowest unoccupied molecular orbital of C70 with optical illumination. Furthermore, photoluminescence spectroscopy and Kelvin probe force microscopy indicate that electron transfer from InSe to C70 in the type-II heterojunction induces a photovoltage that quantitatively matches the observed downshift in the tunneling spectra. In contrast, no significant changes are observed upon optical illumination in the type-I heterojunction formed between InSe and C8-BTBT. Density functional theory calculations further show that, despite the weak coupling between the molecular species and InSe, the band alignment of these mixed-dimensional heterostructures strongly differs from the one suggested by the ionization potential and electronic affinities of the isolated components. Self-energy-corrected density functional theory indicates that these effects are the result of the combination of charge redistribution at the interface and heterogeneous dielectric screening of the electron–electron interactions in the heterostructure. In addition to providing specific insight for mixed-dimensional InSe–organic van der Waals heterostructures, this work establishes a general experimental methodology for studying localized charge transfer at the molecular scale that is applicable to other photoactive nanoscale systems.

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“…The SPR curve relies on dip position, peak depth of angle, width of the curve. The maximum dip in the curve refers to the minimum intensity and maximum reflection, and minimum width of the curve is responsible for maximum resolution and highest signal to noise ratio (SNR) [35]. The shift in the SPR angle dip can be done by changing the refractive index of sensing medium, measured by using the proposed sensor.…”

Section: Proposed Structure and Overview Of Mathematical Conceptmentioning

confidence: 99%

Theoretical study of hazardous carbon‐di‐oxide gas sensing using MIM structure‐based SPR sensing scheme

Srivastava

Verma²,

Prajapati

2021

IET Optoelectronics

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This work mainly focussed on the sensing of the environmentally damaging gas carbon dioxide (CO 2 ) by designing a gas sensor based on a surface plasmon resonance (SPR) principle. The proposed model is based on the metal-insulator-metal (MIM) model which mainly relies on metal thickness, dielectric thickness, and incident light wavelength. A comparative analysis between conventional as well as MIM-based structure is shown in this study and it is observed that by operating at 4400 nm incident light wavelength,the MIM-based structure shows sharp resonance curve, high resolution, minimum FWHM, and extremely high FOM. By using the modified Elden's formulae, the variation in refractive index is investigated by changing the numerical values of humidity, temperature, pressure, and CO 2 content from the reference value, respectively. For each case, the sensitivity has been estimated. By using the proposed MIM-based structure, FOM value as high as 1273.11RIU −1 ; at the end of this article, limit of detection (LOD) is calculated by varying the CO 2 gas concentration.This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.

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Dielectric Properties of SnO₂ Thin Film Using SPR Technique for Gas Sensing Applications

Cited by 5 publications

References 10 publications

Optical Parameters of Nanocrystalline SnO2:F Thin Films Prepared by the Spray Pyrolysis Method

Optical Parameters of Nanocrystalline SnO2:F Thin Films Prepared by the Spray Pyrolysis Method

Molecular-Scale Characterization of Photoinduced Charge Separation in Mixed-Dimensional InSe–Organic van der Waals Heterostructures

Theoretical study of hazardous carbon‐di‐oxide gas sensing using MIM structure‐based SPR sensing scheme

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Dielectric Properties of SnO2 Thin Film Using SPR Technique for Gas Sensing Applications

Cited by 5 publications

References 10 publications

Optical Parameters of Nanocrystalline SnO2:F Thin Films Prepared by the Spray Pyrolysis Method

Optical Parameters of Nanocrystalline SnO2:F Thin Films Prepared by the Spray Pyrolysis Method

Molecular-Scale Characterization of Photoinduced Charge Separation in Mixed-Dimensional InSe–Organic van der Waals Heterostructures

Theoretical study of hazardous carbon‐di‐oxide gas sensing using MIM structure‐based SPR sensing scheme

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Dielectric Properties of SnO₂ Thin Film Using SPR Technique for Gas Sensing Applications