Dielectric properties of plasma polymerized poly(ethylene oxide) thin films

Yakut, Şahin; Ulutaş, Hulusi; Melnichuk, I. A.; Choukourov, Andrei; Biederman, Hynek; Deǧer, D.

doi:10.1016/j.tsf.2016.08.034

Cited by 21 publications

(37 citation statements)

References 44 publications

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“…4 a, b, c, d. This behavior may be attributed that the motion of α and β-relaxations can follow the applied electric field at higher frequencies with increasing temperature [25,26]. At second cooling process, the temperatures at which α-relaxation observed shift toward low temperatures with decreasing thickness as shown in Fig.…”

Section: Resultsmentioning

confidence: 78%

“…The mechanism observed at low frequency side and at high temperatures is called as α-relaxation which is attributed to phase transition of structure from rubber state to glassy state. The other mechanism observed at high frequency side and at low temperatures is called as βrelaxation which is attributed to dipolar fluctuation of side chains [20][21][22][23][24][25][26]. It can be detected that the dielectric constants measured at first cooling are greater than the dielectric constants measured at second cooling.…”

Section: Resultsmentioning

confidence: 99%

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Thickness Dependent Dielectric Loss of Plasma Poly (Ethylene Oxide) Films

Ulutaş

2018

Cumhuriyet Science Journal

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Dielectric properties of plasma poly (ethylene oxide) (pPEO) thin film samples were investigated at room temperature. The thin film samples with different thicknesses were deposited by plasma assisted physical vapor deposition (PAPVD) technique at 5 W plasma discharge power. The thicknesses were 20, 100, 250, 500 nm. It was observed that dielectric constant increases with increasing thickness. The relaxation times determined by dielectric loss-frequency relation, shift toward higher frequencies with increasing thickness. In addition film thickness, heating processes were defined as another parameter. By this purpose, thin film samples were heated and cooled, respectively. It was observed that maxima and minima of dielectric loss at cooling process take place at lower frequencies in comparison with frequencies at which maxima and minima were detected at heating process. These results may show the effect of dead layer at thinner films. After heating process, it was observed from behavior of dielectric constant and dielectric loss that the crosslinking density increases by heating effect. This effect may cause additional reactions between free radicals which are production of PAPVD. Moreover, dynamic glass transition temperatures were calculated. These temperatures prove the effect of dead layer approximation.

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Section: Resultsmentioning

confidence: 78%

Section: Resultsmentioning

confidence: 99%

Thickness Dependent Dielectric Loss of Plasma Poly (Ethylene Oxide) Films

Ulutaş

2018

Cumhuriyet Science Journal

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“…The polarization of these large chain components are called as α-relaxation [31,32]. This relaxation shifts toward lower frequencies with decreasing temperature.…”

Section: Frequency and Temperature Dependence Of Dielectric Constant mentioning

confidence: 99%

“…It is think that this mechanism appears because of the polarization of free radicals originated from side chains and main chain of PEO and small oligomers. This mechanism is called as β-relaxation [31,32]. β-relaxation can be observed at lower frequencies by decreasing temperature.…”

Section: Frequency and Temperature Dependence Of Dielectric Constant mentioning

confidence: 99%

The thickness dependence of dielectric properties in the plasma polymer thin films

Ulutaş

2018

Can. J. Phys.

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In this study, the results of dielectric spectroscopy of plasma polymerized poly(ethylene oxide) thin films are presented. The films were deposited by plasma-assisted physical vapour deposition at radio-frequency plasma discharge power of 5 W, and film thicknesses of 20, 100, and 250 nm. Dielectric measurements of the films were performed in the frequency range of 10−1–107 Hz and temperature was scanned between 173 and 353 K. The dielectric constant ([Formula: see text]) and dielectric loss ([Formula: see text]) of plasma polymerized poly(ethylene oxide) thin films were calculated by measuring capacitance (C) and dielectric loss factor (tanδ). It was observed that there were two relaxation mechanisms in the investigated frequency range. These were called α and β relaxations. These relaxations shift toward higher frequencies with increasing temperature. Moreover, α-relaxation starts to appear at different temperatures. This shows the difference between the polarizability abilities of samples at the same temperature and same frequencies. The reason for this behavior can be expressed by the dead layer concept, which is a result of good adhesion of the bottom layer of plasma polymer to the substrate. In light of these interpretations, with thinner samples it is possible to have structurally similar thin films like thin films deposited at high plasma power. A thinner film may support more transparency and these thinner films may be effective as coverage of optical devices, such as lenses, visors, etc.

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“…Moreover, the properties of the films are highly tunable by the plasma power which was demonstrated with polymers like polyimide [ 19 ], polyethylene [ 20 ], or polylactic acid [ 21 ]. Special interest has been paid to the poly(ethylene oxide) (PEO)-like films [ 22 , 23 , 24 , 25 ].…”

Section: Introductionmentioning

confidence: 99%

Degradable Poly(ethylene oxide)-Like Plasma Polymer Films Used for the Controlled Release of Nisin

et al. 2020

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Poly(ethylene oxide) (PEO)-like thin films were successfully prepared by plasma-assisted vapor thermal deposition (PAVTD). PEO powders with a molar weight (Mw) between 1500 g/mol and 600,000 g/mol were used as bulk precursors. The effect of Mw on the structural and surface properties was analyzed for PEO films prepared at a lower plasma power. Fourier transform (FTIR-ATR) spectroscopy showed that the molecular structure was well preserved regardless of the Mw of the precursors. The stronger impact of the process conditions (the presence/absence of plasma) was proved. Molecular weight polydispersity, as well as wettability, increased in the samples prepared at 5 W. The influence of deposition plasma power (0–30 W) on solubility and permeation properties was evaluated for a bulk precursor of Mw 1500 g/mol. The rate of thickness loss after immersion in water was found to be tunable in this way, with the films prepared at the highest plasma power showing higher stability. The effect of plasma power deposition conditions was also shown during the permeability study. Prepared PEO films were used as a cover, and permeation layers for biologically active nisin molecule and a controlled release of this bacteriocin into water was achieved.

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Dielectric properties of plasma polymerized poly(ethylene oxide) thin films

Cited by 21 publications

References 44 publications

Thickness Dependent Dielectric Loss of Plasma Poly (Ethylene Oxide) Films

Thickness Dependent Dielectric Loss of Plasma Poly (Ethylene Oxide) Films

The thickness dependence of dielectric properties in the plasma polymer thin films

Degradable Poly(ethylene oxide)-Like Plasma Polymer Films Used for the Controlled Release of Nisin

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