Dielectric properties of microwave-baked cake and its constituents over a frequency range of 0.915–2.450GHz

Al-Muhtaseb, Ala’a H.; Hararah, Muhanned A.; Megahey, E.K.; McMinn, W.A.M.; Magee, T.R.A.

doi:10.1016/j.jfoodeng.2009.12.013

Cited by 27 publications

(12 citation statements)

References 29 publications

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“…This allows a comparison of the power lost to the power stored and can be used to describe the material loss (Al-Muhtaseb et al, 2010) The penetration depth, D p , the distance at which the microwave power drops to 1/e (e = 2.718) or 36.8% of the transmitted value of its surface value, is an important parameter in characterizing microwave heating. It is generally related to temperature distribution in microwave heating (Ahmed et al, 2007).…”

Section: Dielectric Property Measurementmentioning

confidence: 99%

Characterization of microwave vacuum-dried durian chips

Bai-Ngew

Therdthai

Dhamvithee

2011

Journal of Food Engineering

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Section: Dielectric Property Measurementmentioning

confidence: 99%

Characterization of microwave vacuum-dried durian chips

Bai-Ngew

Therdthai

Dhamvithee

2011

Journal of Food Engineering

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“…The dielectric properties measurement system consists of three parts: a network analyser (Model E5062A, Agilent Technologies, Santa Clara, CA, USA), as well as an open-ended coaxial probe, together with a calibration kit (Agilent Technologies, Palo Alto, CA, USA), including a hightemperature coaxial cable, and a Agilent 85070E dielectric probe kit. The system was calibrated before each set of measurement because of small variations in the cable position, connections, ambient temperature and other factors can affect the performance of the system (Al-Muhtaseb et al, 2010). The calibration operation was carried out by taking dielectric measurements for three known standards: namely air,a shortening block and distilled water at the required temperature, as prompted by the dielectric probe kit software (Model E5062A; Agilent Technologies).…”

Section: Dielectric Properties Measurementmentioning

confidence: 99%

Changes of microwave structure/dielectric properties during microwave freeze‐drying process banana chips

Jiang

Zhang

Mujumdar

et al. 2014

Int J of Food Sci Tech

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Summary This experimental study investigated the trend of structure and dielectric properties during microwave freeze‐drying process banana chips. The mass of banana samples was 160 g, the microwave power set as 2 W g−1 and the highest drying temperature set as 55 °C. The whole drying process can be finished within 6 h. A network analyser and light microscope were used to determine the dielectric properties and structure. The dielectric properties, ε′ (from 20.80 to 1.20) and ε′′ (from 7.74 to 0.15), and the size of cell get smaller as the drying process continues, especially during the 3–4 h drying, which is the end of primary drying stage and the beginning of secondary drying stage. The trend of dielectric properties and microstructure of samples during drying can be an exact indication of drying stage of MFD.

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“…Because starch has higher microwave loss factors (Al-Muhtaseb et al, 2010). Water thawed by ice also can lead to color changes.…”

Section: Color Change During Different Drying Stages Of Dryingmentioning

confidence: 99%