Dielectric Properties of Epoxy/Anhydride System in Long-Term Storage

Abstract

The change of dielectric properties of epoxy/anhydride systems during eleven months storing was investigated. Test systems were bisphenol-A epoxy cured by different content of methyl-hexahydrophthalic anhydride with a slow cooling process across Tg range included in their curing procedure to reduce residual stress. The results showed all the systems’ dielectric constant and dielectric loss angle tangent had a trend of down then up. The highest decreasing amplitudes were about 4% and 10% respectively. Possible explanations for these phenomena were proposed, and then some preliminary investigations were carried out like DSC and IR.