Dielectric Properties and Crystal Structure of (Mg0.95Ni0.05)4(Nb1-Xtax)2O9 Ceramics

Abstract

The microstructure of (Mg 0.95 Ni 0.05) 4 (Nb 1-x Ta x) 2 O 9 is analyzed using X-ray diffractometry and scanning electron microscopy. The Qxf values of (Mg 0.95 Ni 0.05) 4 (Nb 1-x Ta x) 2 O 9 increases with increasing sintering temperature; and then up to a temperature of 1375°C significantly decreased. The maximum values of the electric permititivity and the quality factor (Qxf) can be obtained 12.76 and 442,000 GHz is obtained for (Mg 0.95 Ni 0.05) 4 (Nb 1-x Ta x) 2 O 9 sintered at 1375°C for 4 h. The temperature coefficient of resonant frequency (τ f) measured for (Mg 0.95 Ni 0.05) 4 (Nb 1-x Ta x) 2 O 9 is −54 ppm/°C.