2016
DOI: 10.2109/jcersj2.15180
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Dielectric properties and crystal structure of (Mg<sub>0.95</sub>Ni<sub>0.05</sub>)<sub>4</sub>(Nb<sub>1&minus;</sub><i><sub>x</sub></i>Ta<i><sub>x</sub></i>)<sub>2</sub>O<sub>9</sub> ceramics

Abstract: The microstructure of (Mg 0.95 Ni 0.05 ) 4 (Nb 1¹x Ta x ) 2 O 9 ceramics was analyzed using X-ray diffractometry and scanning electron microscopy. The quality factor (Q©f ) values of (Mg 0.95 Ni 0.05 ) 4 (Nb 1¹x Ta x ) 2 O 9 (x = 1) ceramics increase with increasing sintering temperature, with the maximum value obtained at 1375°C. The maximum values of electric permittivity (¾) and Q©f were 12.76 and 442,000 GHz, respectively, for (Mg 0.95 Ni 0.05 ) 4 (Nb 1¹x Ta x ) 2 O 9 (x = 1) ceramics sintered at 1375°C fo… Show more

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