“…Therefore, it has become essential to control the optical constants of ZnO. Spectroscopic ellipsometry technique is a relevant tool for such optical analysis [8][9][10][11][12][13][14][15][16][17][18][19]. In the previous works in literature, dispersion laws such as Cauchy [8,9], Forouhi-Bloomer [8,9], Tauc-Lorentz [9][10][11][12], Tanguy [13,14] or wavelength-by-wavelength method [20,21] were used to extract the optical constants of ZnO by modeling spectroscopic ellipsometry (SE) data.…”