Dielectric function of metals determined by surface-plasmon excitation: ambiguities caused by ultrathin oxide layers

Owner-Petersen, Mette; Zhu, Bo-Shen

doi:10.1364/josaa.5.000471

Cited by 5 publications

(2 citation statements)

References 4 publications

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“…ptical waveguides coated with absorbing thin-films is a matter of research since many years both in the analysis of the physics [1][2][3][4][5][6][7][8][9], and in the development of sensors applications mainly focused on chemistry, biology and immunology [9][10][11][12][13]. Different types of modes can be supported by absorbing thin-films [7].…”

Section: Introductionmentioning

confidence: 99%

Generation of Lossy Mode Resonances With Absorbing Thin-Films

Villar

Zamarreño

Hernáez

et al. 2010

J. Lightwave Technol.

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The generation of lossy mode resonances with absorbing thin-films is analyzed with electromagnetic theory. The main differences with surface plasmon resonances are presented and some rules are given towards an optimum design of sensing devices based on absorbing thin-film coated silica substrates. The material selected for the absorbing thin-film is ITO, which is adequate for supporting both surface plasmon resonances and lossy mode resonances.

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Section: Introductionmentioning

confidence: 99%

Generation of Lossy Mode Resonances With Absorbing Thin-Films

Villar

Zamarreño

Hernáez

et al. 2010

J. Lightwave Technol.

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“…10 Figure 2͑a͒ shows typical SPRS equipments with sample detecting systems. 11 And then, the prism is mounted on a high-resolution (Ͼ0.001°) rotation stage. 2͑a͒, the wave of the surface plasmon was generated by p-polarized electromagnetic light.…”

mentioning

confidence: 99%

Efficient characterization of ultrathin AlOx insulating barriers in magnetic tunnel junctions fabricated by masked rf plasma oxidation technique

Park

Lee

Yang

et al. 2002

Applied Physics Letters

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AlO x insulating barriers in magnetic tunnel junctions were prepared by a masked rf plasma oxidation process to reduce direct ion-bombardment effect on the barrier. In our method, the root-mean-square value of 2.1 Å in the barrier and the magnetic resistance ratio up to 32% were observed. In addition, the surface plasmon resonance spectroscopy (SPRS) measurement was performed to efficiently determine optimum oxidation time, dielectric properties, and oxidation states inside thin barrier. The SPRS results revealed that the dielectric value and thickness of the optimum barrier were found to be 1.3576+i1.4488 and 16.3 Å, respectively, with a thickness confirmation by a high resolving transmission electron microscope measurement.

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Optics of Media

Leising

1993

Organic Materials for Photonics

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Dielectric function of metals determined by surface-plasmon excitation: ambiguities caused by ultrathin oxide layers

Cited by 5 publications

References 4 publications

Generation of Lossy Mode Resonances With Absorbing Thin-Films

Generation of Lossy Mode Resonances With Absorbing Thin-Films

Efficient characterization of ultrathin AlOx insulating barriers in magnetic tunnel junctions fabricated by masked rf plasma oxidation technique

Optics of Media

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