Dielectric Characterization of RF-Printed Circuit Board Materials by Microstrip Transmission Lines and Conductor-Backed Coplanar Waveguides Up to 110 GHz

Huber, Oliver; Faseth, Thomas; Magerl, Gottfried; Arthaber, Holger

doi:10.1109/tmtt.2017.2750152

Cited by 25 publications

(15 citation statements)

References 18 publications

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“…The paper by O. Huber, et al, [23] is summary of the use of conductor-backed coplanar waveguide microstrip transmission lines in measuring constant and dielectric permittivity attenuation. The method must take into account several effects, such as frequency dependent, inductance, conductance, surface waves, and resistance, to determine the attenuation constant and dielectric permittivity [24].…”

Section: Review Of the Related Literaturementioning

confidence: 99%

Frequency response analysis of dielectric materials in a parallel-plate transmission line

Africa

Quijano

2021

IJEECS

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A transmission line allows different frequencies to conduct alternating current (AC). They are a peculiar type of wire that allows signal transmission while making it resistant to external noises. A parallel-plate transmission line is a type of transmission line designed with two parallel plates with a dielectric sheet material in the center, as the name implies. The parallel-plate transmission lines are usually used for a miniature setup in which the line prevents the signal from losing power. However, the line's frequency response is a varying setup in which a change in a parameter can fully change the frequency response of the line, and in turn trigger inefficiency. With this, different factors such as the conductor, the size, and the dielectric material of the parallel-plate transmission line can affect its frequency response. Specifically, the analysis of the transmission would test the various frequency responses when the dielectric sheet content is varied. The researchers will carry out experiments on air, Teflon, plexiglass, and E type glass dielectrics.

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Section: Review Of the Related Literaturementioning

confidence: 99%

Frequency response analysis of dielectric materials in a parallel-plate transmission line

Africa

Quijano

2021

IJEECS

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“…Without modifying the transmission line’s structure, some other approaches for extracting the dielectric constant have been offered. Huber [ 18 ] utilized various transmission line structures including microstrip and co-planar waveguide ground (CPWG). A proper empirical formula was provided, and considered several effects (surface waves, frequency dependent conductance, inductance, and resistance) for obtaining the attenuation constant of the line and the dielectric constant (Dk)of the substrate.The method’s validity is demonstrated by measurements of two types of RF-substrate materials up to 110 GHz.…”

Section: Introductionmentioning

confidence: 99%

A Method for Broadband Polyimide Permittivity Measurement of Silicon Interposer Applied for High Speed Digital Microsystem

et al. 2022

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High-speed digital microsystems has emerged as one of the most important solutions for improving system performance, bandwidth, and power consumption. Based on mature micro-system processing technology, a material extraction approach for silicon interposer applied for high-speed digital microsystems was presented in order to obtain frequency-dependent precise material parameters. By combining microwave theory and mathematical model of iterative algorithm, the dielectric constant (Dk) and the dissipation factor (Df) of polyimide dielectric layer is acquired, which minimizes testing costs and streamlines testing process. The method is based on two-port transmission/reflection measurements. Vector Network Analyzer (VNA) is used to extract the scattering parameters with an extraction range of 1 MHz to 10 GHz. The algorithm is programmed using MATLAB. The observed Dk values at 2 GHz, 6 GHz, 8 GHz, and 10 GHz are, respectively, 3.22, 3.04, 2.96, 3.03, and 2.91, while the corresponding Df values are 0.021, 0.025, 0.026, 0.026, and 0.024. Finally, the complex permittivity derived is simulated and analyzed using Ansys HFSS. The results verify the validity of the theoretical method and proves that the values of the complex permittivity obtained by the method in this paper are reliable.

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“…More recently, a variant of state‐of‐the‐art techniques have been incessantly proposed in References 23‐28 Estimation of complex permittivity of DS using only a single measurement of reflection coefficient of an open‐ended microstrip line was presented 23 . In Reference 24, an analytical extraction method for the complex permittivity of multi‐layered DSs was proposed.…”

Section: Introductionmentioning

confidence: 99%

“…At higher microwave and millimeter wave frequencies, surface wave, skin effect and additional conductor and dielectric losses of planar circuits become severe, which not only affects the accurate measurement of dielectric properties but also creates anisotropy of DSs. An interesting technique was proposed in Reference 28 that effectively addressed such problems till 110 GHz.…”

Section: Introductionmentioning

confidence: 99%

Determination of dielectric properties of unknown substrates using hybrid approach

Chung

Guan

Cui

et al. 2020

Int J RF Microw Comput Aided Eng

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Unknown dielectric properties of RF/microwave substrates cause headaches for microwave circuit and antenna designers. Most commercial reinforced dielectric substrates made from layers of woven‐glass and/or ceramic fillings lead to dielectric anisotropy. Often, re‐optimization and even re‐fabrication of designed prototypes are required when measuring results are found to be departed from the prediction. These are time consuming and costly. In order to determine the unknown complex permittivity of any substrates, this paper describes a hybrid approach composed of two measurement stages. The first stage is the coaxial‐probe method for predicting an initial complex permittivity of unknown dielectric substrates, which is known as the perpendicular permittivity. The second stage is the microstrip open‐circuit stub (OCS) method that regulates the complex permittivity of the dielectric laminate by mapping the input impedance curves of OCS via electromagnetic simulation and actual measurement. Three dielectric substrates without prior dielectric properties were selected to validate the proposed method. The equivalent dielectric constants, dissipation factors and dielectric anisotropies were determined and compared. The proposed method is found to be reliable for determining the unknown properties of dielectric substrates.

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Dielectric Characterization of RF-Printed Circuit Board Materials by Microstrip Transmission Lines and Conductor-Backed Coplanar Waveguides Up to 110 GHz

Cited by 25 publications

References 18 publications

Frequency response analysis of dielectric materials in a parallel-plate transmission line

Frequency response analysis of dielectric materials in a parallel-plate transmission line

A Method for Broadband Polyimide Permittivity Measurement of Silicon Interposer Applied for High Speed Digital Microsystem

Determination of dielectric properties of unknown substrates using hybrid approach

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