Dielectric Characterization of Materials at 5G mm-Wave Frequencies

Abstract

The development of the next-generation 5G wireless networks depends critically on the engineering of optimized highfrequency devices, employing dielectric materials. This work presents a comprehensive broadband dielectric characterization of polymers, ceramics and glasses from 5 GHz until 115 GHz. Various measurement techniques including split-post, split cavity, open resonator and free-space transmission are utilized to obtain wideband spectra. The frequency-dependent permittivity and loss tangent are analyzed to identify suitable candidate materials exhibiting minimal dispersion and loss in the 5G millimeter-wave bands. The characterization reveals almost constant permittivity and a loss tangent that increases linearly with the frequency.