Dielectric and Ferroelectric Properties of Ba_1-xSr_xTiO₃ Thin Films Prepared by Pulsed Laser Deposition

Abstract

In this work, BST (x=0.7, 0.5, 0.3) films have been deposited onto Nb-SrTiO3 substrate with pulsed laser deposition. The crystal structure and surface morphology have been characterized by X-ray diffraction (XRD) and atomic force microscopy, respectively. XRD results revealed that in certain elaboration condition the films were aligned along (00l) direction, normal to the substrate surface. The dielectric loss, relative dielectric permitivity, and polarization of BST films strongly depended on Sr content at room temperature. The tunability of relative dielectric permitivity of BST films exhibited strongly dependence on Sr content, and BST-0.5 shows the maximun K (K = tunability/loss) value.

Systematic investigation of the annealing temperature and composition effects on the dielectric properties of sol–gel BaxSr1−xTiO3 thin films

“…Many studies have been carried out concerning the Ba/Sr ratio effect, on the optical properties [5][6][7][8], on nanomechanical characteristics [9], on the electrical properties [10][11] or dielectric properties at low frequencies [12] and microwave frequencies [13][14][15].…”