2022
DOI: 10.1016/j.ceramint.2022.05.326
|View full text |Cite
|
Sign up to set email alerts
|

Dielectric and ferroelectric properties of multilayer BaTiO3/NiFe2O4 thin films prepared by solution deposition technique

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 40 publications
0
1
0
Order By: Relevance
“…Meanwhile, a broad peak is observed in the dielectric loss curves that move towards the low frequency as the magnetic field is increased, as shown in Figure 3b. These features further confirmed the ME coupling in the as-prepared bilayers [34].…”
Section: Resultssupporting
confidence: 76%
See 1 more Smart Citation
“…Meanwhile, a broad peak is observed in the dielectric loss curves that move towards the low frequency as the magnetic field is increased, as shown in Figure 3b. These features further confirmed the ME coupling in the as-prepared bilayers [34].…”
Section: Resultssupporting
confidence: 76%
“…Meanwhile, a broad peak is observed in the dielectric loss curves that move towards the low frequency as the magnetic field is increased, as shown in Figure 3b. These features further confirmed the ME coupling in the as-prepared bilayers [34]. To further investigate the micro-magnetoelectric properties, PFM was used to study the distribution of ferroelectric domains in films under different magnetic fields.…”
Section: Resultssupporting
confidence: 64%
“…Many multiferroics have been reported, such as BTO/ NFO [13], BTO/Ni 0.5 Zn 0.5 Fe 2 O 4 [14,15], PZT/NFO [12], BTO/CoFe 2 O 4 [16], BTO/Co 0.7 Fe 2.3 O 4 [17], BTO/Mn 0.7 Zn 0.3 Fe 2 O 4 [18], SrTiO 3 /Co 0.7 Fe 2.3 O 4 [19], Ba 0.8 Sr 0.2 TiO 3 / Co 0.5 Cu 0.5 Fe 2 O 4 [20], Co 0.6 Cu 0.3 Zn 0.1 Fe 2 O 4 /Ba 0.9 Sr 0.1 Zr 0.1 Ti 0.9 O 3 [21], Na 0.5 Bi 0.5 TiO 3 /Co 0.75 Zn 0.25 Cr 0.2 Fe 1.8 O 4 [22], etc. However, the remaining issue was the reaction between ferromagnetic and ferroelectric phases during the annealing/sintering process.…”
Section: Introductionmentioning
confidence: 99%