Dielectric and Electrical Properties of Copper-Polyimide-Copper Structures

Abstract

Experimental study of current-voltage (I-V) characteristics and frequency dependences of impedance in copper-Kapton-copper structures in the temperature range 240 – 300 K were carried out. Concentration and mobility of charge carriers thermally excited from traps with exponential distribution by energy in Kapton bulk and metal-Kapton interface and injected from copper electrodes into Kapton were estimated from the fitting of experimental I-V curves within the frame of the model of the space charge limited current (SCLC). Concentration and the width of energy of localized states, arising from the disorder of the Kapton structure, are additionally estimated from the I-V characteristics.